A prerequisite for the use of an e-beam tester to examine the timing behavior at a particular net is a periodically repeated pattern sequence at the inputs of the circuit which causes a periodic signal change at the investigated net. This pattern sequence must be short to obtain a sufficient voltage resolution in an acceptable measurement time. In those cases where the pattern sequence is applied via a scan path the measurements can take a long time due to the serial access of the scan path. Therefore in this paper an algorithm based on deterministic test pattern generation is presented generating pattern sequences of minimal length for scan-based designs. Experimental results with several representative benchmark circuits containing up to 1.760 inputs and up to 24.000 nets show that the sequence lengths are independent of the circuit size and that the average length is only 3,3. Independent of the underlying parameters of the e-beam test equipment the resulting measurement times are more than one order of magnitude smaller than those times achieved by a worst case estimation.