Abstract
A new technique is presented which is used for prototype validation in cases where detailed CAD data is not available. It is especially valuable if the CAD data cannot be linked to the E-beam tester. The technique is based on acquiring stroboscopic voltage contrast images to cover a large circuit with adequate resolution - Multiple Adjacent Image Processing (MAIP). Sets of adjacent images are taken for different circuit input conditions, and facilitates the simple tracing of propagation paths. A real case study of a video analogue to digital converter is presented to evaluate the technique.
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