Positron Annihilation Induced Auger Electron Research Articles

In-situ observation of the temperature and orientation dependence of the surface concentration of Ni adatoms deposited on Pd

We report the direct observation of the in-situ temperature-dependent migration of Ni adatoms in Pd using Positron annihilation induced Auger Electron Spectroscopy (PAES). For this study, a single atomic layer of Ni was grown on Pd with the crystallographic orientations Pd(111), Pd(110) and Pd(100). The sample temperature was increased from room temperature to 350 °C and the intensity of the Ni and Pd signal was evaluated from the recorded PAES spectra. Due to the outstanding surface sensitivity of PAES a clear tendency for Pd segregation at the surface was observed for all samples. Moreover the activation temperature T0 for surface segregation was found to depend strongly on the surface orientation: We determined T0 to 172± 4 °C, 261± 12 °C and 326± 11 °C for Pd(111), Pd(100) and Pd(110), respectively.

Comparative Study of Time-Dependent PAES and XPS on a Ni/Pd Surface

We report on time-dependent Positron annihilation induced Auger Electron Spectroscopy (PAES) study on 0.5 monolayers (ML) Ni on polycrystalline Pd accompanied by complementary X-ray induced Photoelectron Spectroscopy (XPS). The normalized PAES spectra showed a significant decrease in the Ni intensity and an increase in the Pd intensity as a function of time. To rule out varying influence on the elements e.g. from surface contaminates due to the residual gas, a time-dependent XPS analysis was performed on pure Ni and Pd as well as to analyze the main contaminants C and O. The O fraction was found to be constant within the measurement time and the time constants for C significantly differ from those of Ni and Pd in the PAES data. Consequently, it was concluded that the PAES data show a superposition of C contamination and structural changes at the surface of Ni/Pd.

Modelling the line shape of very low energy peaks of positron beam induced secondary electrons measured using a time of flight spectrometer

In this paper, we present results of numerical modelling of the University of Texas at Arlington’s time of flight positron annihilation induced Auger electron spectrometer (UTA TOF-PAES) using SIMION® 8.1 Ion and Electron Optics Simulator. The time of flight (TOF) spectrometer measures the energy of electrons emitted from the surface of a sample as a result of the interaction of low energy positrons with the sample surface. We have used SIMION® 8.1 to calculate the times of flight spectra of electrons leaving the sample surface with energies and angles dispersed according to distribution functions chosen to model the positron induced electron emission process and have thus obtained an estimate of the true electron energy distribution. The simulated TOF distribution was convolved with a Gaussian timing resolution function and compared to the experimental distribution. The broadening observed in the simulated TOF spectra was found to be consistent with that observed in the experimental secondary electron spectra of Cu generated as a result of positrons incident with energy 1.5 eV to 901 eV, when a timing resolution of 2.3 ns was assumed.

Low energy positron beam system for the investigation of 2D and porous materials

An advanced variable energy positron beam (~2 eV to 20 keV) has been designed, tested and utilized for coincidence Doppler broadening (CDB) measurements at the University of Texas at Arlington (UTA). A high efficiency solidified rare gas (Neon) moderator was used for the generation of a slow positron beam. The gamma rays produced as a result of the annihilation of positrons with the sample electrons are measured using a high purity Germanium (HPGe) detector in coincidence with a NaI(Tl) detector. Modifications to the system, currently underway, permits simultaneous measurements utilizing Positron annihilation induced Auger Electron Spectroscopy (PAES) and CDB. The tendency of positrons to become trapped in an image potential well at the surface will allow the new system to be used in measurements of the chemical structure of surfaces, internal or external and interfaces. The system will utilize a time of flight (TOF) technique for electron energy measurements. A 3m flight path from the sample to a micro-channel plate (MCP) in the new system will give it superior energy resolution at higher electron energies as compared to previous TOF systems utilizing shorter flight paths.

Iterative fitting method for the evaluation and quantification of PAES spectra

The elemental composition of surfaces is of great importance for the understanding of many surface processes such as catalysis. For a reliable analysis and a comparison of results, the quantification of the measured data is indispensable. Positron annihilation induced Auger Electron Spectroscopy (PAES) is a spectroscopic technique that measures the elemental composition with outstanding surface sensitivity, but up to now, no standardized evaluation procedure for PAES spectra is available. In this paper we present a new approach for the evaluation of PAES spectra of compounds, using the spectra obtained for the pure elements as reference. The measured spectrum is then fitted by a linear combination of the reference spectra by varying their intensities. The comparison of the results of the fitting routine with a calculation of the full parameter range shows an excellent agreement. We present the results of the new analysis method to evaluate the PAES spectra of sub-monolayers of Ni on a Pd substrate.

Time of flight spectrometer for background-free positron annihilation induced Auger electron spectroscopy.

We describe a novel spectrometer designed for positron annihilation induced Auger electron spectroscopy employing a time-of-flight spectrometer. The spectrometer's new configuration enables us to implant monoenergetic positrons with kinetic energies as low as 1.5 eV on the sample while simultaneously allowing for the detection of electrons emitted from the sample surface at kinetic energies ranging from ∼500 eV to 0 eV. The spectrometer's unique characteristics made it possible to perform (a) first experiments demonstrating the direct transition of a positron from an unbound scattering state to a bound surface state and (b) the first experiments demonstrating that Auger electron spectra can be obtained down to 0 eV without the beam induced secondary electron background obscuring the low energy part of the spectra. Data are presented which show alternative means of estimating positron surface state binding energy and background-free Auger spectra.

Time-dependent investigation of sub-monolayers of Ni on Pd using Positron-annihilation induced Auger Electron Spectroscopy and XPS

The surface of a polycrystalline Pd-substrate covered with (sub-) monolayers of Ni was investigated with Positron-annihilation induced Auger Electron Spectroscopy (PAES). Comparative studies using conventional AES induced by electrons and X-rays showed the outstanding surface sensitivity of PAES. Time-dependent PAES was performed on a 0.5ML Ni cover layer on Pd and compared with conventional X-ray induced Photoelectron Spectroscopy (XPS) in order to observe changes in the elemental composition of the surface. The PAES results appear to show a migration of Ni atoms into the Pd substrate, whereas the Ni signal shows a decrease of 12% within 13h with respect to the initial value.

PAES: Positron annihilation induced Auger electron spectrometer

Positron annihilation induced Auger electron spectroscopy (PAES) is a newly developed application for surface studies with high elemental selectivity and exceptional surface sensitivity. The instrument is operated by the Technische Universität München and is located at NEPOMUC.

Evidence for a positron bound state on the surface of a topological insulator

We describe experiments aimed at probing the sticking of positrons to the surfaces of topological insulators using the Positron Annihilation induced Auger Electron Spectrometer (PAES). A magnetically guided beam was used to deposit positrons at the surface of Bi2Te2Se sample at energy of ∼2eV. Peaks observed in the energy spectra and intensities of electrons emitted as a result of positron annihilation showed peaks at energies corresponding to Auger peaks in Bi, Teand Se providing clear evidence of Auger emission associated with the annihilation of positrons in a surface bound state. Theoretical estimates of the binding energy of this state are compared with estimates obtained by measuring the incident beam energy threshold for secondary electron emission and the temperature dependence positronium(Ps) emission. The experiments provide strong evidence for the existence of a positron bound state at the surface of Bi2Te2Se and indicate the practicality of using positron annihilation to selectively probe the critically important top most layer of topological insulator system.

Measurement of the Positron Annihilation Induced Auger Electron Spectrum from Ag(100)

Research has demonstrated that Positron Annihilation Induced Auger Spectroscopy (PAES) can be used to probe the top-most atomic layer of surfaces and to obtain Auger spectra that are completely free of beam-impact induced secondary background. The high degree of surface selectivity in PAES is a result of the fact that positrons implanted at low energies are trapped with high efficiency at an image-correlation potential well at the surface resulting in almost all of the positrons annihilating with atoms in the top-most layer. Secondary electrons associated with the impact of the incident positrons can be eliminated by a suitable choice of an incident beam energy. In this paper we present the results of measurements of the energy spectrum of electrons emitted as a result of positron annihilation induced Auger electron emission from a clean Ag(100) surface using a series of incident beam energies ranging from 20 eV down to 2 eV. A peak in the spectrum was observed at ~40 eV corresponding to the N2,3VV Auger transition in agreement with previous PAES studies. This peak was accompanied by an even larger low energy tail which persisted even at the lowest beam energies. Our results for Ag(100) are consistent with previous studies of Cu and Au and indicate that a significant fraction of electrons leaving the sample are emitted in the low energy tail and suggest a strong mechanism for energy sharing in the Auger process.

Surface states and annihilation characteristics of positrons trapped at the oxidized Cu(100) surface

In this work we present the results of theoretical studies of positron surface and bulk states and annihilation probabilities of surface-trapped positrons with relevant core electrons at the oxidized Cu(100) surface under conditions of high oxygen coverage. Oxidation of the Cu(100) surface has been studied by performing an ab-initio investigation of the stability and electronic structure of the Cu(100) missing row reconstructed surface at various on-surface and subsurface oxygen coverages ranging from 0.5 to 1.5 monolayers using density functional theory (DFT). All studied structures have been found to be energetically more favorable as compared to structures formed by purely on-surface oxygen adsorption. The observed decrease in the positron work function when oxygen atoms occupy on-surface and subsurface sites has been attributed to a significant charge redistribution within the first two layers, buckling effects within each layer and an interlayer expansion. The computed positron binding energy, positron surface state wave function, and annihilation probabilities of the surface trapped positrons with relevant core electrons demonstrate their sensitivity to oxygen coverage, atomic structure of the topmost layers of surfaces, and charge transfer effects. Theoretical results are compared with experimental data obtained from studies of oxidation of the Cu(100) surface using positron annihilation induced Auger electron spectroscopy (PAES). The results presented provide an explanation for the changes observed in the probability of annihilation of surface trapped positrons with Cu 3p core-level electrons as a function of annealing temperature.

High resolution positron annihilation induced Auger electron spectroscopy of the CuM 2,3VV-transition and of Cu sub-monolayers on Pd and Fe

We present a high resolution positron annihilation induced Auger Electron Spectroscopy (PAES) of the CuM 2,3VV-transition with the unprecedented energy resolution of Δ E E < 1 % . This energy resolution and the highly intense positron source NEPOMUC enabled us to resolve the double peak structure with PAES for the first time within a measurement time of only 5.5 h. In addition, sub-monolayers of Cu were deposited on Fe- and Pd-samples in order to investigate the surface selectivity of PAES in comparison with EAES. The extremely high surface selectivity of PAES due to the different positron affinity of Cu and Fe lead to the result that with only 0.96 monolayer of Cu on Fe more than 55% of the emitted Auger electrons stem from Cu, whereas with EAES the Cu Auger fraction amounted to less than 6%.

High-resolution Auger-electron spectroscopy induced by positron annihilation on Fe, Ni, Cu, Zn, Pd, and Au

Positron annihilation induced Auger electron spectroscopy (PAES) enables almost background free, non-destructive surface analysis with high surface selectivity. The Auger-spectrometer at the high intense positron source NEPOMUC now allows to record positron annihilation induced Auger spectra within a short data acquisition time of 10-80 minutes. With a new hemispherical electron energy analyzer and due to the exceptional peak to noise ratio, we succeeded to measure Auger-transitions such as the M2,3V V double peak of nickel with high energy resolution. The relative Auger-electron intensities are obtained by the analysis of the recorded positron annihilation induced Auger spectra for the surfaces of Fe, Ni, Cu, Pd and Au. It is demonstrated, that high-resolution PAES allows to determine experimentally the relative surface core annihilation probability of various atomic levels.

Oxidation and thermal reduction of the Cu(1 0 0) surface as studied using positron annihilation induced Auger electron spectroscopy (PAES)

Changes in the surface of an oxidized Cu(1 0 0) single crystal resulting from vacuum annealing have been investigated using positron annihilation induced Auger electron spectroscopy (PAES). PAES measurements show a large increase in the intensity of the annihilation induced Cu M 2,3VV Auger peak as the sample is subjected to a series of isochronal anneals in vacuum up to annealing temperature 300 °C. The intensity then decreases monotonically as the annealing temperature is increased to ∼600 °C. Experimental probabilities of annihilation of surface-trapped positrons with Cu 3p and O 1s core-level electrons are estimated from the measured intensities of the positron annihilation induced Cu M 2,3VV and O KLL Auger transitions. Experimental PAES results are analyzed by performing calculations of positron surface states and annihilation probabilities of surface-trapped positrons with relevant core electrons taking into account the charge redistribution at the surface, surface reconstructions, and electron–positron correlations effects. The effects of oxygen adsorption on localization of positron surface state wave function and annihilation characteristics are also analyzed. Possible explanation is proposed for the observed behavior of the intensity of positron annihilation induced Cu M 2,3VV and O KLL Auger peaks and probabilities of annihilation of surface-trapped positrons with Cu 3p and O 1s core-level electrons with changes of the annealing temperature.

양전자 소멸 Auger 전자 에너지 측정을 위한 Time of Flight의 분해도 향상에 관한 이론적 연구

저에너지(수 eV) 양전자 빔을 이용하여 도체나 반도체의 표면/계면의 물리화학적 특성 분석에 독특한 유용성이 보고 되고 있다. 기존의 표면 분석법에 비해 표면의 선택도가 향상되어 반도체 소자의 박막 두께가 얇아지는 최신기술에 적합한 분석법으로 주목을 받고 있다. 물질표면에 조사된 저에너지 양전자는 표면 근처의 image potential에 포획이 되어 표면에 있는 전자들과 쌍소멸하며 Auger 전자를 방출한다. 표면으로부터 방출된 Auger 전자의 에너지를 측정함으로 원자의 화학적 구별이 가능하므로 검출기의 에너지 분해도가 중요하다. 기존의 ExB 형태의 에너지 측정기는 분해도가 <TEX>$6{\sim}10\;eV$</TEX> 정도이고 특정한 에너지 영역만을 일정시간 스캔하여 스펙트럼을 측정하므로 측정시간이 길어진다는 단점이 있다. 반면에 Time-Of-Flight(TOF) 시스템은 방출되는 전자들의 에너지를 동시에 검출하므로 측정시간이 단축되어 측정 효율이 향상된다. 에너지 분해도를 높이기 위해서는 측정하고자 하는 전자의 진행거리를 길게 할수록 좋으나, 공간적 제약을 고려한 reflected TOF 시스템과 retarding tube을 이용한 linear TOF 시스템의 에너지 분해도를 이론적으로 시뮬레이션하였다. Since the presence of the chemical impurities and defect at surfaces and interfaces greatly influence the properties of various semiconductor devices, an unambiguous chemical characterization of the metal and semiconductor surfaces become more important in the view of the miniaturization of the devices toward nano scale. Among the various conventional surface characterization tools, Electron-induced Auger Electron Spectroscopy (EAES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Electron Ion Mass Spectroscopy (SIMS) are being used for the identification of the surface chemical impurities. Recently, a novel surface characterizaion technique, Positron-annihilation induced Auger Electron Spectroscopy (PAES) is introduced to provide a unique method for the analysis of the elemental composition of the top-most atomic layer. In PAES, monoenergetic positron of a few eV are implanted to the surface under study and these positrons become thermalized near the surface. A fraction of the thermalized positron trapped at the surface state annihilate with the neighboring core-level electrons, creating core-hole excitations, which initiate the Auger process with the emission of Auger electrons almost simultaneously with the emission of annihilating gamma-rays. The energy of electrons is generally determined by employing ExB energy selector, which shows a poor resolution of <TEX>$6{\sim}10eV$</TEX>. In this paper, time-of-flight system is employed to measure the electrons energy with an enhanced energy resolution. The experimental result is compared with simulation results in the case of both linear (with retarding tube) and reflected TOF systems.

Surface and bulk investigations at the high intensity positron beam facility NEPOMUC

The NEutron-induced POsitron source MUniCh (NEPOMUC) at the research reactor FRM II delivers a low-energy positron beam ( E = 15–1000 eV) of high intensity in the range between 4 × 10 7 and 5 × 10 8 moderated positrons per second. At present four experimental facilities are in operation at NEPOMUC: a coincident Doppler-broadening spectrometer (CDBS) for defect spectroscopy and investigations of the chemical vicinity of defects, a positron annihilation-induced Auger-electron spectrometer (PAES) for surface studies and an apparatus for the production of the negatively charged positronium ion Ps −. Recently, the pulsed low-energy positron system (PLEPS) has been connected to the NEPOMUC beam line, and first positron lifetime spectra were recorded within short measurement times. A positron remoderation unit which is operated with a tungsten single crystal in back reflection geometry has been implemented in order to improve the beam brilliance. An overview of NEPOMUC's status, experimental results and recent developments at the running spectrometers are presented.

Study of the surface contamination of copper with the improved positron annihilation-induced Auger electron spectrometer at NEPOMUC

The high intensity positron source NEPOMUC at the FRM-II in Munich enables measurement times for positron annihilation-induced Auger electron spectroscopy (PAES) of only 2.4 h/spectrum, in contrast to usual lab beams with measurement times up to several days. The high electron background due to surrounding experiments in the experimental hall of the FRM-II has been eliminated and hence background free experiments have become possible. Due to this, the signal to noise ratio has been enhanced to 4.5:1, compared to 1:3 with EAES. In addition, a long-term measurement has been performed in order to observe the contamination of a polycrystalline copper foil at 150 °C.

A positron remoderator for the high intensity positron source NEPOMUC

A remoderator for the high intensity positron source NEPOMUC was developed and installed at the beam facility. A beam of remoderated positrons could be produced with different energies and a diameter of less than 2 mm was obtained. The efficiency of the remoderation setup was determined to be 5%. Due to the brilliance of the remoderated beam, the measurements at the coincidence Doppler broadening spectrometer (CDBS) and at the positron annihilation induced Auger electron spectrometer (PAES) could be improved. The setup and functionality of the remoderation device is presented as well as the first measurements at the remoderator, CDBS and PAES.

Study of cuprous oxide using time of flight positron annihilation induced Auger electron spectroscopy

AbstractChanges in the surface of copper (I) oxide resulting from vacuum annealing and reoxidation after vacuum annealing have been investigated using positron annihilation induced Auger electron spectroscopy (PAES). The PAES measurement shows a large monotonic increase in the intensity of the annihilation induced Cu (M2,3 VV) Auger peak as the sample is subjected to thermal anneal in the vacuum at 300 °C temperature for 13 minutes. Exposure of the vacuum annealed surface to oxygen resulted in a large reduction of Cu (M2,3 VV) intensity and an increase in the signal due to the KLL transition in O. These results provide a clear demonstration of the utility of PAES in the study of oxide surfaces. (© 2007 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)

Positron annihilation induced Auger electron spectroscopy of Cu and Si

AbstractPAES‐measurements on polycrystalline Cu, Si(100) and Cu coated Si(100) were performed at the intense positron source NEPOMUC in Munich. First results with considerably reduced electron background are presented. The surface sensitivity of PAES is shown and compared with conventional EAES. In addition, the measurement time could be reduced to three hours in order to observe the Cu M2,3VV‐Auger transition. (© 2007 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)