Modelling the line shape of very low energy peaks of positron beam induced secondary electrons measured using a time of flight spectrometer

Abstract

In this paper, we present results of numerical modelling of the University of Texas at Arlington’s time of flight positron annihilation induced Auger electron spectrometer (UTA TOF-PAES) using SIMION® 8.1 Ion and Electron Optics Simulator. The time of flight (TOF) spectrometer measures the energy of electrons emitted from the surface of a sample as a result of the interaction of low energy positrons with the sample surface. We have used SIMION® 8.1 to calculate the times of flight spectra of electrons leaving the sample surface with energies and angles dispersed according to distribution functions chosen to model the positron induced electron emission process and have thus obtained an estimate of the true electron energy distribution. The simulated TOF distribution was convolved with a Gaussian timing resolution function and compared to the experimental distribution. The broadening observed in the simulated TOF spectra was found to be consistent with that observed in the experimental secondary electron spectra of Cu generated as a result of positrons incident with energy 1.5 eV to 901 eV, when a timing resolution of 2.3 ns was assumed.