10-bit Successive Approximation Register Research Articles

A Wireless Miniature Injectable Device with Memory-Assisted Backscatter for Multimodal Animal Physiological Monitoring.

This paper introduces a wirelessly powered multimodal animal physiological monitoring application-specific integrated circuit (ASIC). Fabricated in the 180 nm process, the ASIC can be integrated into an injectable device to monitor subcutaneous body temperature, electrocardiography (ECG), and photoplethysmography (PPG). To minimize the device size, the ASIC employs a miniature receiver (Rx) coil for wireless power receiving and data communication through a single inductive link operating at 13.56 MHz. We propose a folded L-shape Rx coil with improved coupling to the transmitter (Tx) coil, even in the presence of misalignment, and enhanced quality factor. The ASIC functions alternatively between recording and sleeping modes, consuming 2.55 μW on average. For PPG measurements, a reflection-type PPG sensor illuminates an LED with tunable current pulses. A current-input analog frontend (AFE) amplifies the current of a photodiode (PD) with 30.8 pARMS current input-referred noise (IRN). The ECG AFE captures ECG signals with a configurable gain of 45-80 dB. The temperature AFE achieves 0.02 ̊C inaccuracy within a sensing range between 27-47 ̊C. The AFE outputs are sequentially digitized by a 10-bit successive approximation register (SAR) analog-to-digital converter (ADC) with an effective number of bits (ENOB) of 8.79. To improve the reliability of data transmission, we propose a memory-assisted backscatter scheme that stores ADC data in an off-chip memory and transmits it when the coupling condition is stable. This scheme achieves a package loss rate (PLR) lower than 0.2% while allowing 24-hour data storage. The device's functionality has been evaluated by in vivo experiments.

A Wirelessly Powered Scattered Neural Recording Wearable System.

This paper introduces a wirelessly powered scattered neural recording wearable system that can facilitate continuous, untethered, and long-term electroencephalogram (EEG) recording. The proposed system, including 32 standalone EEG recording devices and a central controller, is incorporated in a wearable form factor. The standalone devices are sparsely distributed on the scalp, allowing for flexible placement and varying quantities to provide extensive spatial coverage and scalability. Each standalone device featuring a low-power EEG recording application-specific integrated circuit (ASIC) wirelessly receives power through a 60 MHz inductive link. The low-power ASIC design (84.6 μW) ensures sufficient wireless power reception through a small receiver (Rx) coil. The 60 MHz inductive link also serves as the data carrier for wireless communication between standalone devices and the central controller, eliminating the need for additional data antennas. All these efforts contribute to the miniaturization of standalone devices with dimensions of 12×12×5 mm3, enhancing device wearability. The central controller applies the pulse width modulation (PWM) scheme on the 60 MHz carrier, transmitting user commands at 4 Mbps to EEG recording ASICs. The ASIC employs a novel synchronized PWM demodulator to extract user commands, operating signal digitization and data transmission. The analog frontend (AFE) amplifies the EEG signal with a gain of 45 dB and applies band-pass filtering from 0.03 Hz to 400 Hz, with an input-referred noise (IRN) of 3.62 μVRMS. The amplified EEG signal is then digitized by a 10-bit successive approximation register (SAR) analog-to-digital converter (ADC) with a peak signal-to-noise and distortion ratio (SNDR) of 55.4 dB. The resulting EEG data is transmitted to an external software-defined radio (SDR) Rx through load-shift-keying (LSK) backscatter at 3.75 Mbps. The system's functionality is fully evaluated in human experiments.

An 8-bit successive-approximation register analog-to-digital converter operating at 125 kS/s with enhanced comparator in 180 nm CMOS technology

Data converters are necessary for the conversion process of analog and digital signals. Successive approximation register (SAR) analog-to-digital converters (ADC) can achieve high levels of accuracy while consuming relatively low amounts of power and operating at relatively high speeds. This paper describes a design of 8-bit 125 kS/s SAR ADC with a proposed high-speed comparator design based on dynamic latch architecture. The proposed design of the comparator enhances the performance compared to a conventional dynamic comparator by adding two parallel clocked input complementary metal-oxide semiconductor (CMOS) transistors which reduce the parasitic resistance in the latch ground path and serve to minimize the latch delay time. The design of each sub-system for the ADC is explained thoroughly, which contains a sample and hold circuit, successive approximation register, charge redistribution types digital-to-analog converter, and the new proposed comparator. The proposed design is implemented using 180 nm CMOS technology with a power supply of 1.2 V. The average inaccuracy in differential non-linearity (DNL) is +0.6/−0.8 LSB (least significant bit), and integral non-linearity (INL) is +0.4/−0.7 LSB. The proposed design exhibits a delay time of 157 ps at 1 MHz clock frequency.

A foreground calibration technique with multi-level dither for a 14-bit 1-MS/s SAR ADC

A foreground calibration is proposed to obtain the real weights in the split capacitor digital-to-analog- converter (CDAC) of a 14-bit 1-MS/s successive-approximation-register (SAR) ADC. Since the non-linearity of high-resolution SAR ADC is mainly caused by the mismatch of capacitors, calibration of weights of more significant bits is necessary when the resolution of SAR ADC comes to more than 12 bits. By injecting a multi-level dither signal in both the calibration and conversion phases of the calibration scheme, the precision and non-linearity of SAR ADC can be significantly improved. Simulation results indicate that the peak signal-to-noise-and-distortion ratio (SNDR) and the spurious-free dynamic range (SFDR) achieve 79.93 dB and 91.21 dB by employing the proposed calibration technique in a 14-bit split-CDAC SAR ADC. Besides, integral non-linearity (INL) achieves 0.22 least-significant bit (LSB).

Readout Circuit Design for RRAM Array-Based Computing in Memory Architecture

In recent advancements, the traditional von Neumann architecture has been challenged by the computational needs of AI. This is due to its high power and data transfer costs. As a solution, the computing-in-memory (CIM) architecture, which combines storage and computation, has gained attention for its superior computational power and energy efficiency. Within CIM, using resistive random access memory (RRAM) arrays, the readout circuit, which converts analog outputs from multiply–accumulate operations into digital signals, faces limitations due to its area and power consumption. There are mainly two types of CIM readout circuits for analog types: the traditional ADC type and the non-traditional type. This paper presents two types of readout circuit designs. The first is a low-power, compact successive approximation register (SAR) analog-to-digital converter (ADC) readout circuit. The core circuit is an 8-bit SAR ADC operating at 70 MS/s. It incorporates a linearity-improved bootstrapped switch to minimize leakage and enhance linearity, whose spurious-free dynamic range (SFDR) has been improved by 10.1 dB from 76.78 dB to 86.88 dB, and whose signal-to-noise and distortion ratio (SNDR) has increased by 4.56 dB from 75.13 dB to 79.69 dB. The delay of a transconductance-enhanced dynamic comparator is reduced from 184 ps to 149 ps, presenting a performance improvement of approximately 20%. Concurrently, the energy consumption decreased from 178 μm to 132 μm, attaining an improvement of roughly 26%. A “sandwich” capacitor structure is used that reduces the overall area of the layout. After layout and post-simulation, this circuit occupies only 49.6 μm × 51.5 μm, consumes 553 μW power, has a SINAD of 46.22 dB, and has an SFDR of 57.21 dB. The second is a current controlled oscillator (CCO)-type readout circuit, which comprises a CCO oscillator with low process-sensitivity. The readout circuit also utilizes an op-amp and current mirrors for a negative feedback loop, ensuring a constant voltage across the RRAM arrays. The frequency generated through the CCO is controlled by the current, and quantified by a counter, supporting different weights quantification per ReRAM column without additional digital weighting. This circuit achieves 95-level resolution, 5.2 μs delay, and an average consumption of 183.1 μW. A comparative analysis highlights that traditional ADC readout circuits offer high resolution and speed but are limited by their high power and area costs, often overshadowing CIM arrays’ benefits. Thus, for applications with more lenient resolution and speed requirements, non-traditional readout circuits present considerable advantages.

A 14-Bit Hybrid Analog-to-Digital Converter for Infrared Focal Plane Array Digital Readout Integrated Circuit.

This paper presents a 14-bit hybrid column-parallel compact analog-to-digital converter (ADC) for the application of digital infrared focal plane arrays (IRFPAs) with compromised power and speed performance. The proposed hybrid ADC works in two phases: in the first phase, a 7-bit successive approximation register (SAR) ADC performs coarse quantization; in the second phase, a 7-bit single-slope (SS) ADC performs fine quantization to complete the residue voltage conversion. In this work, the number of unit capacitors is reduced to 1/128th of that of a conventional 14-bit SAR ADC, which is beneficial for the application of small pixel-pitch IRFPAs. In this work, a tradeoff segmented thermometer-coded digital-to-analog converter (DAC) is adopted in the first 7-bit coarse quantization process: the lower 3-bit is binary coded, and the upper 4-bit is thermometer coded. A thermometer-coded DAC can improve the linearity of ADC. Capacitor array matching can be incredibly relaxed compared with a binary-weight 14-bit SAR ADC, resulting in a noncalibration feature. Moreover, by sharing DAC and comparator analog circuits between the SAR ADC and the SS ADC, the power consumption and layout area are consequently reduced. The proposed hybrid ADC was fabricated using a 180 nm CMOS process. The measurement results show that the proposed ADC has a differential nonlinearity of -0.61/+0.84 LSB and a sampling rate of 120 kS/s. The developed ADC achieves a temporal noise of 1.7 LSBrms at a temperature of 77 K. In addition, the SNDR is 72.9 dB, and the ENOB is 11.82 bit, respectively. Total power consumption is 71 μW from supply voltages of 3.3 V (analog) and 1.8 V (digital).

An Energy-Efficient 12-Bit VCO-Based Incremental Zoom ADC with Fast Phase-Alignment Scheme for Multi-Channel Biomedical Applications

This paper presents a low-power, energy-efficient, 12-bit incremental zoom analog-to-digital converter (ADC) for multi-channel bio-signal acquisitions. The ADC consists of a 7-stage ring voltage-controlled oscillator (VCO)-based incremental ΔΣ modulator (I-ΔΣM) and an 8-bit successive approximation register (SAR) ADC. The proposed VCO-based I-ΔΣM can provide fast phase-alignment of the ring-VCO to reduce the interval settling time; thereby, the I-ΔΣM can accommodate time-division-multiplexed input signals without phase leakage between consecutive measurements. The SAR ADC also adopts splitting unit capacitors that can support VCM-free tri-level switching and prevent invalid states from the phase frequency detector with minimal logic gates and switches. The proposed ADC has been fabricated in a standard 180 nm standard 1P6M CMOS process, exhibiting a 67-dB peak signal-to-noise ratio, a 74-dB dynamic range, and a Walden figure of merit of 19.12 fJ/c-s, while consuming a power of 3.51 μW with a sampling rate of 100 kS/s.

Ultra-low power 10-bit 50–90 MSps SAR ADCs in 65 nm CMOS for multi-channel ASICs

The design and measurement results of ultra-low power, fast 10-bit Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) prototypes in 65 nm CMOS technology are presented. Eight prototype ADCs were designed using two different switching schemes of capacitive Digital-to-Analog Converter (DAC), based on MIM or MOM capacitors, and controlled by standard or low-power SAR logic. The layout of each ADC prototype is drawn in 60 μm pitch to make it ready for multi-channel implementation. A series of measurements have been made confirming that all prototypes are fully functional, and six of them achieve very good quantitative performance. Five out of eight ADCs show both integral (INL) and differential (DNL) nonlinearity errors below 1 LSB. In dynamic measurements performed at 0.1 Nyquist input frequency, the effective number of bits (ENOB) between 8.9–9.3 was obtained for different ADC prototypes. Standard ADC versions work up to 80–90 MSps with ENOB between 8.9–9.2 bits at the highest sampling rate, while the low-power versions work up to above 50 MSps with ENOB around 9.3 bits at 40 MSps. The power consumption is linear with the sample rate and at 40 MSps it is around 400 μW for the low-power ADCs and just over 500 μW for the standard ADCs. At 80 MSps the standard ADCs consume about 1 mW.

A 14-bit 1-MS/s SAR ADC with a segmented capacitor array and background mismatch calibration for IoT sensing applications

A 14-bit 1-MS/s successive-approximation-register (SAR) analog-to-digital converter (ADC) for IoT sensing devices is proposed. With a VCM-based switching scheme, the 14-bit SAR ADC can lower 68.7 % switching energy consumption and 97.9 % capacitor array area by utilizing a segmented capacitor array compared to the conventional binary capacitor array. Although the root-mean-square integral nonlinearity (INL) and differential nonlinearity (DNL) of the segmented capacitor array is decreased compared with the binary capacitor array at the capacitance mismatch of 1 %, the capacitor mismatch can be background calibrated and the power consumption of the digital calibration circuit is increased by only 55.4 μW under the identical calibration step condition, and there is no noticeable deterioration in the calibration speed, resulting in a significant improvement in power efficiency. In addition, a voltage-controlled oscillator (VCO)-based comparator based on the reset-in-time technique and the adaptive stage adjustment technique is employed to further reduce power consumption. Post-simulation results show that the proposed 14-bit prototype SAR ADC can enhance the signal-to-noise distortion ratio (SNDR) and spurious-free dynamic range (SFDR) by 13.35 dB and 16.72 dB respectively at a Nyquist input rate and a sampling rate of 1-MS/s. With a power supply of 1.8 V, the power consumption is 597.8 μW with a figure of merit (FoM) value of 83.3 fJ/Conv.-step in a 0.18-μm CMOS process. The total area is 0.208 mm2, of which the analog part is only 0.038 mm2.

Memristor-Assisted Background Calibration for SAR ADCs: A Feasibility Study

This paper proposes a memristor-assisted sign-based background calibration scheme for analog-to-digital converters (ADCs). The scheme was implemented and validated in a 12-bit asynchronous successive approximation register (SAR) ADC, which consists of a hybrid binary weighted/R-2R digital-to-analog converter (binary/R-2R DAC) and other peripheral circuits. This hybrid DAC, in which one redundancy bit is introduced, is built with a memristor and standard polysilicon resistors. The proposed calibration technique can detect the errors caused by DAC mismatches and correct them by adjusting the resistance of the memristor (memristance) in a feedback loop. The implemented circuit takes the memristor’s advantages such as small area and resistance switching property. The proposed scheme has been designed and simulated in a standard 180 nm CMOS process. Eventually, a monolithic CMOS/memristor chip will be fabricated with the CMOS part processed at a standard foundry and the memristors integrated through post-CMOS processing in house. Simulation results demonstrate the feasibility of exploiting memristors to improve the linearity of high-resolution SAR ADCs. The designed calibration scheme can effectively reduce the integral non-linearity (INL) and differential non-linearity (DNL) of the 12-bit SAR ADC.

A Data Weight Averaging-Inspired Digital Calibration Method for a 10-Bit Noise-Shaping Successive Approximation Register

This paper presents a digital calibration method for a 10-bit noise-shaping Successive Approximation Register Analog to Digital Converter (SAR ADC). The proposed calibration method is inspired by its Data Weight Averaging (DWA) counterpart, but stays static, while achieving a similar Integral Nonlinearity (INL) and 1.3 dB better Signal-to-Noise Ratio (SNR) in measurements without oversampling. This advantage in SNR holds until an Oversampling Ratio (OSR) of 2 for the proposed method, which also saves 50 % power. At a 1.2 V power supply, the ADC consumes a power of 70 µW at a conversion rate of 50 kHz. Fabricated using 55 nm Complementary Metal Oxide Semiconductor (CMOS) Metal-Oxide-Metal Capacitor (MOMCAP) technology, it occupies an active area of 370 µm × 350 µm, when achieving an INL of 0.3 Least Significant Bit (LSB) and an SNR of 66.9 dB at an OSR of 8.

Transition Point Estimation Using RC-Filtered Square Wave for Calibration of SAR ADC

Successive-approximation register (SAR) ADCs are susceptible to non-linearities due to capacitor mismatch. This paper proposes a transition points-based calibration of the SAR ADC using an RC-filtered square wave by looking at the histogram of output digital codes to improve the linearity without any additional analog circuitry. The proposed method is validated with an 8-bit SAR ADC fabricated in UMC 180-nm CMOS. The proposed calibration algorithm improves the signal-to-noise and distortion ratio (SNDR) of the 8-bit ADC from 42.87 dB to 46.91 dB, and the spurious-free dynamic range (SFDR) from 51.95 dB to 60.61 dB.

A Low-Power 12-Bit SAR ADC for Analog Convolutional Kernel of Mixed-Signal CNN Accelerator

As deep learning techniques such as Convolutional Neural Networks (CNNs) are widely adopted, the complexity of CNNs is rapidly increasing due to the growing demand for CNN accelerator system-on-chip (SoC). Although conventional CNN accelerators can reduce the computational time of learning and inference tasks, they tend to occupy large chip areas due to many multiply-and-accumulate (MAC) operators when implemented in complex digital circuits, incurring excessive power consumption. To overcome these drawbacks, this work implements an analog convolutional filter consisting of an analog multiply-and-accumulate arithmetic circuit along with an analog-to-digital converter (ADC). This paper introduces the architecture of an analog convolutional kernel comprised of low-power ultra-small circuits for neural network accelerator chips. ADC is an essential component of the analog convolutional kernel used to convert the analog convolutional result to digital values to be stored in memory. This work presents the implementation of a highly low-power and area-efficient 12-bit Successive Approximation Register (SAR) ADC. Unlink most other SAR-ADCs with differential structure; the proposed ADC employs a single-ended capacitor array to support the preceding single-ended max-pooling circuit along with minimal power consumption. The SAR ADC implementation also introduces a unique circuit that reduces kick-back noise to increase performance. It was implemented in a test chip using a 55 nm CMOS process. It demonstrates that the proposed ADC reduces Kick-back noise by 40% and consequently improves the ADC’s resolution by about 10% while providing a near rail-to-rail dynamic range with significantly lower power consumption than conventional ADCs. The ADC test chip shows a chip size of 4600 μm² with a power consumption of 6.6 μW while providing an signal-to-noise-and-distortion ratio (SNDR) of 68.45 dB, corresponding to an effective number of bits (ENOB) of 11.07 bits.

An Energy-Efficient SAR ADC With a Coarse-Fine Bypass Window Technique

This paper presents a coarse-fine bypass window technique to improve the energy efficiency of the successive approximation register (SAR) analog-to-digital converter (ADC) by skipping unnecessary conversion cycles when the input signal is within the bypass windows. It utilizes the time information of the MSB comparison to coarsely detect the input range without a dedicated timing budget. Based on the coarse detection results, the fine bypass window is configured by reusing the digital-to-analog converter (DAC) to accurately detect the input signal. Due to the presence of the coarse detection, the multi-window detection and its corresponding bypass operation are realized to maximize the effectiveness of the bypass window technique. In addition, the MSB-spilt switching scheme is proposed to reduce the DAC switch-back energy. A prototype 8-bit SAR ADC equipped with the proposed technique is fabricated in a 65-nm CMOS process. At a 350-MS/s sampling rate with a Nyquist input, the measured signal-to-noise-plus-distortion ratio (SNDR) and spurious-free dynamic ranges (SFDR) are 44.9 dB and 63.9 dB, respectively. At a supply voltage of 1.2 V, the ADC consumes power of 1.58 mW with the full-scale sinusoidal input signal. The ADC achieves an effective number of bits (ENOB) of 7.17 bit, resulting in a figure-of-merit (FoM) of 31.3 fJ/conversion-step. The ADC core occupies an active area of 0.0096 mm2.

A 7.6-nW 1-kS/s 10-Bit SAR ADC for Biomedical Applications.

This paper presents a 10-bit successive approximation register analog-to-digital converter with energy-efficient low-complexity switching scheme, automatic ON/OFF comparator and automatic ON/OFF SAR logic for biomedical applications. The energy-efficient switching scheme achieves an average digital-to-analog converter switching energy of 63.56 CVref2, achieving a reduction of 95.34% compared with the conventional capacitor switching scheme for CDACs. With the switching scheme, the ADC can lower the dependency on the accuracy of Vcm and complexity of DAC control logic and DAC driver circuit. Moreover, dynamic circuits and automatic ON/OFF technology are used to reduce power consumption of comparator and SAR logic. The prototype is designed and fabricated in a 180 nm CMOS with a core size of 500 μm × 300 μm (0.15 mm2). It consumes 7.6 nW at 1 kS/s sampling rate and 1.8-V supply with an achieved signal-to-noise-and distortion ratio of 45.90 dB and a resulting figure of merit of 51.7 fJ/conv.-step.

A low‐power and area‐efficient ultrasound receiver using beamforming successive approximation register analog‐to‐digital converter with capacitive digital‐to‐analog converter combined delay cell structure for 3‐D imaging systems

The authors present a low-power area-efficient subarray beamforming receiver (RX) structure for a miniaturized 3-D ultrasound imaging system. Given that the delay-and-sum (DAS) and digitization functions consume most of the area and power in the receiver, the beamforming successive approximation register (SAR) analog-to-digital converter (ADC) shares its capacitive digital-to-analog converter (CDAC) with the delay cells. As a result, the delay cells implemented with capacitors are embedded in the CDAC with significant area reduction, further eliminating the need for power-hungry ADC buffers. Furthermore, the dual reference 10-bit SAR ADC reduces the area of CDAC by 32 times, achieving a switching energy reduction of 98.3%, compared to the conventional SAR ADC. As a result, the proposed beamforming SAR ADC, simulated using a 0.18 μm CMOS process, consumes 230 μW per channel, significantly reducing the per channel capacitance.

A 900-MS/s SAR-Based Time-Interleaved ADC With a Fully Programmable Interleaving Factor and On-Chip Scalable Background Calibrations

This brief presents a 12-bit successive approximation register (SAR)-based time-interleaved (TI) analog-to-digital converter (ADC) with a fully programmable interleaving factor. A total of six SAR sub-ADCs can be time-interleaved. The interleaving factor is programmable from 2 to 6, resulting in an overall sampling rate from 300 to 900MS/s. On-chip offset, gain, and timing skew background calibrations allow reducing the interleaving spurs to less than −73dBc in every configuration. In particular, the proposed difference-based skew calibration efficiently operates in any configuration, not being limited to power-of-2 interleaving factors. Fabricated in a 28-nm bulk CMOS process, the presented TI-ADC achieves a Nyquist-frequency signal-to-noise plus distortion ratio (SNDR) and a spurious-free dynamic range (SFDR) of 52.01dB and 58.82dBc at 900MS/s, respectively, with an active area occupation of 0.48 mm <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{\mathbf {2}}$ </tex-math></inline-formula> and similar metrics across all the configurations. Featuring a power dissipation of 42.96mW at 900MS/s, the Nyquist-frequency Schreier figure of merit (FoM) is 152.2dB, whereas the Walden one is 146.6fJ/Conv-step.

Ultra-Low Power SAR ADC Using Statistical Characteristics of Low-Activity Signals

Low-activity signals, such as voice, electrocardiogram (ECG), and ultrasonic signals, in the Internet-of-Things applications have both posed unique challenges and offered special opportunities for modern analog-to-digital conversion. This article presents a new successive approximation register (SAR) analog-to-digital converter (ADC) search methodology, which is aimed at low-activity signals for reducing comparator activity and switching energy of digital-to-analog converter (DAC). By using statistical histogram information of the low-activity signals, two search solutions are proposed. The first solution is designed for some part of signal that has small difference between two adjacent samples, while the second solution is designed for that with large difference. To engage one suitable solution, the digital interval between two adjacent samples needs to be detected. In addition, a new DAC tactic is proposed to reduce the activity of DAC switches. Our simulated 10-bit SAR ADC for voice signals shows that by using our proposed method, the comparator activity is reduced by 62.09%, and the DAC switching energy is decreased by 85.90% compared to the monotonic method. In addition, the activity of DAC switches is further trimmed by 39.66% compared to the monotonic method.

A 11.42-ENOB 6.02 fJ/conversion-step SAR-assisted digital-slope ADC with a reset-in-time VCO-based comparator for power reduction

A successive approximation register (SAR)-assisted digital-slope analog-to-digital converter (ADC) with an “8-bit + 4-bit” hybrid topology is presented. In the coarse quantization with an 8-bit SAR ADC, a voltage-controlled oscillator (VCO)-based comparator with a reset-in-time function is proposed for energy saving. Once the phase detector generates the comparison result, the VCO resets to significantly reduce the power of the comparator. Moreover, in a 4-bit fine digital-slope ADC, the delay cell is reused from the VCO-based comparator to the delay line; thus, the area of the entire ADC is reduced to a certain extent. The proposed ADC is designed using 0.18-µm CMOS technology and can operate at a supply voltage as low as 0.6 V. The ADC achieves a signal-to-noise-and-distortion ratio of 70.53 dB with a sampling rate of 20 kS/s and an input frequency of 9.74 kHz. The power consumption is only 330 nW, and the Walden figure-of-merit is 6.02 fJ/conversion-step, making it suitable for low-supply low power internet-of-things applications.

A 12-Bit 1 GS/s RF Sampling Pipeline-SAR ADC With Harmonic Injecting Cross-Coupled Pair Achieving 7.5 fj/Conv-Step

We present an RF sampling 1 GS/s 12-bit single-channel successive approximation register (SAR) assisted pipeline analog to digital converter (ADC). A novel Harmonic-injecting Cross-Coupled Pair (HXCP) is proposed in a <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{G}_{\text {m}}$ </tex-math></inline-formula> -R based residue amplifier design as a critical part of the presented ADC. This technique overcomes the challenges in designing analog amplifiers using advanced nanometer CMOS processes and achieves the gain and linearity required for the ADC. By implementing the HXCP in a residue amplifier (RA), the proposed technique successfully improves the RA linearity by at least 10 dB and meanwhile boosts the gain of the RA to be about 8. The entire ADC consists of three stages each with 4-bit, 4-bit, and 6-bit, respectively. Two one-bit interstage redundancies are implemented between the three stages. Various techniques are also implemented to help the ADC achieve the targeted speed and resolution. The presented ADC was implemented in a 28nm CMOS process and achieves an ERBW of 1 GHz, an SNDR of 60.7 dB, an SFDR of 73 dB at Nyquist input (495 MHz) and an SFDR of 82 dB at 1 GHz input. A 7.5 fj/conv-step FoM <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">w</sub> and a 169.4 dB FoMs are achieved, which demonstrate one of the best Figure of Merits (FoMs) among ADCs of similar speed and resolution.