Abstract

This paper presents a digital calibration method for a 10-bit noise-shaping Successive Approximation Register Analog to Digital Converter (SAR ADC). The proposed calibration method is inspired by its Data Weight Averaging (DWA) counterpart, but stays static, while achieving a similar Integral Nonlinearity (INL) and 1.3 dB better Signal-to-Noise Ratio (SNR) in measurements without oversampling. This advantage in SNR holds until an Oversampling Ratio (OSR) of 2 for the proposed method, which also saves 50 % power. At a 1.2 V power supply, the ADC consumes a power of 70 µW at a conversion rate of 50 kHz. Fabricated using 55 nm Complementary Metal Oxide Semiconductor (CMOS) Metal-Oxide-Metal Capacitor (MOMCAP) technology, it occupies an active area of 370 µm × 350 µm, when achieving an INL of 0.3 Least Significant Bit (LSB) and an SNR of 66.9 dB at an OSR of 8.

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