The development of the Material Science EXAFS line which covers the energy range of 4 keV to > 25 keV is described. The general design parameters of the line have been developed specifically for the application of X-ray absorption spectroscopy to problems in material science. The optics systems consisting of a vertically collimating SiC mirror and a unique four crystal monochromator are described along with the results of extensive ray tracing studies. The two backend configurations to be used on this line will also be discussed.
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