Memristors with digital or analog resistive switching characteristics have the potential to acquire high-performance data storage or electronic synaptic device applications, respectively. It is considerably important to realize coexistence of digital and analog resistive switching characteristics for high-performance memristor applications. In this study, the nanocrystalline yttrium-iron-garnet Y3Fe5O12 (YIG) thin film was synthesized on Pt substrates by a facile solution-processed method, and it can be used as resistive switching layer for fabricating memory devices. The digital and analog resistive switching characteristics in YIG thin film devices were achieved by employing inert platinum and active silver electrodes, respectively. Oxygen vacancy-controlled conductive filaments (CFs) with Pt/YIG/Pt structure exhibited digital resistive switching behavior which can be modulated by changing voltage polarity. The resistive switching mode with positive Set/Reset in the Pt/YIG/Pt device acquired superior resistive switching properties. Ag/YIG/Pt device exhibited analog resistive switching characteristics based on the formation of Ag-based CFs. The conductance increase during Set operation and decrease during Reset process by adjusting current gradients and voltage windows, respectively. The present study exhibits an effective path to obtain the digital and analog resistive switching properties, which opens a door for understanding and optimizing resistive switching performance.
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