This work analyzes a set of Full Adder circuits considering variability effects, comparing delay and energy consumption when operating at nominal voltage and near-threshold voltage. The decoupling cell technique was adopted for reducing process variability effects. It is evaluated traditional adders and XOR-based adders in different scenarios, from traditional nominal conditions to circuits with decoupling cells addition. Mirror Adder still is the best alternative to performance optimization at nominal voltage operation. The near-threshold operation can reduce the power by 97% on average for the evaluated circuits, with penalties of 6.4 times on delay and increasing up to 2 times the process variability sensitivity. XOR-based FAs are less sensitive to process variability effects on power, independently of the voltage operation. Moreover, the decoupling cell technique brought benefits to all evaluated adders about the mitigation of process variability effects on power, since this technique introduces a reduction in the power consumption of the circuits. So, the use of decoupling cells demonstrates to be a good option to achieve greater robustness to variability impact regarding the circuits power consumption. • Process Variability affects the expected behavior of circuits at nanometer nodes. • FinFET devices show better control of short-channel effects and radiation robustness. • Even so, process variability is a considerable challenge. arithmetic blocks. • This work proposes adoption of XOR-based Full Adders, together with the decoupling cells mitigation technique, to reduce the process variability deviation. • Decoupling cells brought benefits to all evaluated adders about the mitigation of process variability effects on power.
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