Radiative tunneling among randomly dstributed donors (D) and acceptors (A) is one of the most efficient processes responsible for the visible luminescence (VL) in many semiconductors (SCs). However, the quantum yield of these transitions may be strongly affected by presence of the other, usually deep, centers. The best known deactivators (killers) of VL in ZnS are transition metal (TM) impurities. In the previous papers [1, 2] two deactivation mechanisms were identified. Recently O,Donnel et al. [3] proposed a new one which can limit the donor—acceptor pair (DAP) luminescence in ZnSe:Fe. During this process an electron tunnels from a donor (D) to iron instead of acceptor (Α) (Fig. 1). In this paper we present the results of photoESR studies of recharging process in ZnS crystals. By selecting the experimental temperature and conditions we could obtain the metastably occupied D, A, Fe and Cr centers with their depopulation monitored via the studies of Fe 3+ and Cr+ ESR signal intensities. At low temperature this depopulation occurs only due to tunneling transitions of e.g. A Cr type. Hence, the decay kinetics of the Fe3+ and Cr+ ESR signals enables us to estimate the tunneling efficiencies among activator and killer centers. The effIciency of the DAP luminescence is usually characterized by two parameters: W0 and α. This comes from the fact that the tunneling rate W(r) between given donor and an acceptor located at a distance r is taken in the form:
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