Highly tensile-strained (TS) InGaAs/lattice-matched (LM) InGaAlAs MQWs for 1.3 μm emission wavelength were grown by MBE and their properties were characterized by photoluminescence (PL) measurements and cross-sectional transmission electron microscopy (TEM). The energy band of the TS-InGaAs/LM-InGaAlAs MQW was theoretically calculated using a 6×6 Luttinger-Kohn Hamiltonian. The tensile strains for the wells were varied from 1.0% to 1.5%, while lattice match was used for barriers. The wells and barriers have well-defined interfaces for TS-InGaAs/LM-InGaAlAs MQWs with a tensile strain ( ε) of 1.0% and 1.25%, respectively. However, significant non-planarity between wells and barriers was observed for TS-InGaAs/LM-InGaAlAs MQWs with a tensile strain of 1.5%. For ε=1.0%, 1.25%, and 1.5%, two peaks were observed in each PL spectrum. The longer wavelength peak is attributed to an electron–light hole (E1–LH1) transition while the shorter wavelength peak to an electron–heavy hole (E1–HH1) transition. While the E1–HH1 transition is dominant at ε=1.0%, the E1–LH1 transition is dominant at ε=1.25% and 1.5%. The E1–LH1 transition was clearly observed with increasing well number. The total PL intensity increased as the well number increased from 1 to 4 QWs. However, the total PL intensity decreased with 5 QWs. Therefore, the maximum well number is limited to 4, constituting a compromise between well number and strain relaxation.
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