In this work, nanocrystalline Fe thin films on a Si (100) substrate were successfully prepared using the oblique-angle sputtering technique coupled with applying an external magnetic field of 200 Oe. The crystalline structure, the static magnetic properties, and the high-frequency magnetic characteristics of the as-deposited film were examined using the X-ray diffraction, the M–H loop tracer and the network analyzer, respectively. The results indicate that the nanocrystalline BCC phase of Fe with the average crystallite size of 9.4–11.3 nm and (110) preferred orientation is formed during the deposition process. The difference between M–H loops measured along easy and hard axes confirms the existence of a high in-plane uniaxial magnetic anisotropy which increases with increasing the incident angle. As a result, the ferromagnetic resonance frequency is shifted from 1.02 to 1.88 GHz with an increase of the oblique angle from 0 to 45°. In addition, the film deposited at the oblique angle of 45°, indicates good thermal stability with the maximum imaginary permeability of 513 at 420 K.