Abstract
This letter reports the growth of metastable phase Co5Zr (CZ5) in thin film form using rf-magnetron sputtering without adding a stabilizing element. Thin films show [1 1 0] oriented growth on MgO (1 0 0) single-crystal substrates. X ray diffraction studies along with complementary rocking curve analysis and HRTEM imaging confirm the [1 1 0] oriented growth of films. Evolution of hard magnetic phase is clearly observed in the magnetic force microscopy images for thin film grown at 600 °C with ~1 μm average domain size. Same sample shows optimum magnetic properties with coercivity (Hc) ~647Oe, measured for field parallel to [1 1 0]. The M-H loops indicate [1 1 0] as easy axis and [0 0 1] as hard axis with anisotropy energy density (ku) ~7.8 × 105 erg/cm3 and anisotropic field (HA) ~3.7 kOe.
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