This paper gives an overview of diagnostic methods for the characterization of inhomogeneities of parameters of GTO segments, and their behaviour under static and dynamic conditions. In addition to measuring the forward voltage drop, OCVD lifetime and breakdown voltage of the cathode junction, the paper describes the measurement of small-signal current gains applied to the investigation of the inhomogeneities. Optical methods, such as the recombination radiation technique and the free-carrier absorption technique, are also discussed.
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