Quantum-dot cellular automaton (QCA) has emerged as one of the best alternatives to CMOS technology in nanoscale. In spite of the potential advantages of QCA technology over CMOS, QCA circuits often suffer from various types of manufacturing defects and are therefore prone to fault. Hence, the design of fault-tolerant circuits in QCA technology is considered a necessity. The implementation of multiplexer circuits in QCA technology has been of great interest to researchers due to its widespread use in memory circuits and ALUs. In most of the multiplexer circuits presented in QCA, the problem of fault-tolerant is ignored. In this paper, a novel fault-tolerant three-input majority gate is initially proposed. The proposed structure has been investigated against all kinds of cell omission, extra cell deposition, and cell displacement defects. The simulation results are verified by QCA Designer 2.0.3, and it showed that it is 100, 84.98, and 100% tolerant to single-cell omission, double-cell omission, and extra cell deposition, respectively. In addition, the proposed structure shows that it is robust against cell displacement defects. Moreover, physical investigations are provided in order to confirm the function of the proposed fault-tolerant structure. Finally, using the proposed structure, a novel single-layer 2:1 multiplexer is presented. The results of comparisons indicate that the proposed designs are more reliable than the existing designs. Furthermore, QCAPro power estimator tool is employed to estimate the energy dissipation of the proposed structure.