Abstract: The theoretical estimation of the effect of electron localization in the upper valleys in the narrow-band channel of transistor heterostructures AlxGa1–xAs-GaAs with two-sided doping on the value оf drift velocity overshoot is carried out. It is shown that for transistor heterostructures with donor-acceptor doping, in which the proportion of electrons transferred from the narrow-band channel to the wide-band material is less than in conventional structures, in some cases, the drift velocity increase can reach 15 % due to the localization of electrons in the upper valleys in the narrow-band channel. The studied effect can be an additional mechanism for increasing the current in transistors based on heterostructures with donor-acceptor doping.