DC conductivity and Hall effect measurements are made in undeformed and plastically deformed (by indentation) n-type GaAs samples between 77 and 300 K. The studies show that the dislocation-assisted vacancy complexes of activation energy 0.015-0.010 eV are present in deformed samples. The electron mobility of these samples is explained by considering different scattering processes. In plastically deformed samples an additional scattering mobility due to dislocation-assisted vacancy complexes is suggested to explain the experimental mobilities. The centres responsible for this scattering are associated with native vacancy complexes segregated at the dislocation sites. The fresh dislocation motion, mainly α-dislocations (with higher mobility than β-dislocations) help the creation and movement of acceptor vacancies and their segregation as complexes at the dislocation sites. The complex scattering mobility of electrons has been found to vary linearly with temperature in all the deformed samples. These complexes are also found to be temperature-insensitive throughout the extrinsic region of the sample.
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