Cadmium zinc telluride (CdZnTe) is a highly effective semiconductor material, renowned for its exceptional properties. In this study, we employed the close-spaced sublimation method to grow high-quality CdZnTe thick films on sapphire substrates. The effects of growth temperature on the composition, surface defects, and structural and electrical properties of CdZnTe films were examined. The investigation identified the optimal temperature conditions for the production of thick CdZnTe films of high quality. These were found to be a sublimation temperature of 675°C and a substrate temperature of 450°C. Furthermore, we have produced CdZnTe thick-film radiation detectors based on sapphire substrates. The detectors demonstrated an energy resolution of 18.9% when subjected to 59.54keV 241 Am γ-ray irradiation. The results of our investigation suggest that these CdZnTe thick film detectors have the potential to be employed in future low-cost, large-area imaging applications.
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