Abstract
CdZnTe (CZT) films were grown by closed space sublimation (CSS) method on (111)-oriented CZT wafers, non-oriented CZT wafers and FTO substrates. The compositional and morphological properties of CZT films on different substrates were characterized by scanning electron microscopy (SEM) and atomic force microscopy (AFM), which indicated that CZT films grown on (111)-oriented CZT wafers had low dislocation density and high Zn composition. X-ray diffraction (XRD) measurements confirmed that CZT films grown on (111)-oriented CZT wafers had the best crystal quality. The I-V and DC photoconductivity measurements indicated that CZT films on (111)-oriented CZT wafer had good carrier transport performance. The energy spectra of CZT films grown on (111)-oriented CZT wafer presented that it had a good response to the nuclear radiation under 241Am.
Highlights
Cadmium zinc telluride (CZT) is an II-VI compound semiconductor with excellent performance, which has attracted wide attention in the fabrication of detectors, especially on nuclear detection devices [1,2,3,4]
The surface morphology, structural and electrical properties of CZT films grown on different substrates were studied in detail, which contributes to their applications on the nuclear radiation detectors
The structural properties of CZT films on different kinds of substrates were measured by X-ray diffraction (XRD, Rigaku Ultima IV)
Summary
Cadmium zinc telluride (CZT) is an II-VI compound semiconductor with excellent performance, which has attracted wide attention in the fabrication of detectors, especially on nuclear detection devices [1,2,3,4]. The single-crystal CZT bulk with a large-diameter, high μτ, and good homogeneity is difficult to achieve. The cost of CZT crystal is high and the growth process is complex. The electrical properties of CZT films are similar to those of CZT single crystal, but the growth process of CZT films is easier and the cost is lower. Some researchers have reported deposition of CZT films on GaAs substrate for radiation detectors [20]. The effect of substrates to the properties of CZT films still needs further study. The surface morphology, structural and electrical properties of CZT films grown on different substrates were studied in detail, which contributes to their applications on the nuclear radiation detectors
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