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Abstract
Cadmium telluride (CdTe) is an important Ⅱ-Ⅵ multifunctional semiconductor, often used as the light absorption layer in photovoltaic solar cells or the core layer in γ-ray detection. The deposition temperature has a great greatly influences on the microstructure and morphology of the thin films during their growth. Here, close spaced sublimation method is used for depositing CdTe thin films on glass substrate at various temperatures conditions. The microstructure, morphology, optical and luminescent properties of the CdTe thin films were systematically characterized. CdTe thin films with a high preferred crystal orientation, large grain size, low micro-stress, and strong luminescence performance were obtained. And the origin of luminescent peaks is analyzed in detail by low-temperature photoluminescence spectroscopy.
Published Version
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