The article is dealing with uncertainty analyses of radiofrequency circuits electromagnetic compatibility emission based on the near-field/near-field (NF/NF) transform combined with stochastic approach. By using 2D data corresponding to electromagnetic (EM) field (X=E or H) scanned in the observation plane placed at the position z0 above the circuit under test (CUT), the X field map was extracted. Then, uncertainty analyses were assessed via the statistical moments from X component. In addition, stochastic collocation based was considered and calculations were applied to planar EM NF radiated by the CUTs as Wilkinson power divider and a microstrip line operating at GHz levels. After Matlab implementation, the mean and standard deviation were assessed. The present study illustrates how the variations of environmental parameters may impact EM fields. The NF uncertainty methodology can be applied to any physical parameter effects in complex environment and useful for printed circuit board (PCBs) design guideline.