Methodology and Equipments for Analog Circuit Parametric Faults Diagnosis Based on Matrix Eigenvalues

Abstract

A method and corresponding equipments for analog circuit parametric faults diagnosis based on matrix eigenvalues are presented in this paper. The proposed method organizes the discrete samples of response signals of the circuits under test (CUT) into a square matrix and calculates out the maximal and minimal eigenvalues of the square matrix. According to the one-to-one correspondence relationship between the matrix elements and fault cases, fault detection and fault location are achieved by using the maximal and minimal eigenvalues as fault signatures. Two experimental results show that the proposed method has better fault coverage, higher computational efficiency and needs fewer test points than the other state-of-the-art methods. Without the necessary of node-voltage equation or internal structure analysis, solely, depending on the analysis of the output response of CUT to achieve the fault diagnosis, the presented method is particularly suitable for the analog integrated circuit fault diagnosis, and can be extended to solve the fault diagnosis for superconductor digital circuits with finite accessible nodes.