A hybrid deposition process consisting of reactive high-power pulsed and dc magnetron cosputtering (HIPIMS and DCMS) from Ti and Al targets is used to grow Ti1−xAlxN alloys, with x~0.6, on Si(001) at 500°C. Two series of films are deposited in which the energy and momentum of metal ions incident at the growing film are individually varied. In both sets of experiments, a negative bias Vs ranging from 20 to 280V is applied to the substrate in synchronous, as determined by in-situ mass spectrometry, with the metal-ion-rich part of the HIPIMS pulse. Ion momentum is varied by switching the HIPIMS and dc power supplies to change the mass m and average charge of the primary metal ion. Al-HIPIMS/Ti-DCMS layers grown under Al+ (mAl=26.98amu) bombardment with 20≤Vs≤160V are single-phase NaCl-structure alloys, while films deposited with Vs>160V are two-phase, cubic plus wurtzite. The corresponding critical average metal-ion momentum transfer per deposited atom for phase separation is 〈pd⁎〉≥135 [eV-amu]1/2. In distinct contrast, layers deposited in the Ti-HIPIMS/Al-DCMS configuration with Ti+/Ti2+ (mTi=47.88amu) ion irradiation are two-phase even with the lowest bias, Vs=20V, for which 〈pd⁎〉>135 [eV-amu]1/2. Precipitation of wurtzite-structure AlN is primarily determined by the average metal-ion momentum transfer to the growing film, rather than by the deposited metal-ion energy. Ti-HIPIMS/Al-DCMS layers grown with Vs=20V are two-phase with compressive stress σ=−2GPa which increases to −6.2GPa at Vs=120V; hardness H values range from 17.5 to 27GPa and are directly correlated with σ. However, for Al-HIPIMS/Ti-DCMS, the relatively low mass and single charge of the Al+ ion permits tuning properties of metastable cubic Ti0.38Al0.62N by adjusting Vs to vary, for example, the hardness from 12 to 31GPa while maintaining σ~0.
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