Abstract
We present an epitaxial stabilization of pyrochlore Bi2Rh2O7 on the Y-stabilized ZrO2 (YSZ) (111) substrate by inserting a pyrochlore Eu2Ti2O7 template layer, otherwise Bi-based layered structures being formed directly on the YSZ (111) substrate. This result reveals that “iso-structural crystal phase” plays an important role in the interfacial phase control. The Bi2Rh2O7 film exhibits p-type electrical conduction with the lowest longitudinal resistivity (ρxx) among the reported Rh pyrochlore oxides. Such parameters as ρxx, carrier density, and mobility show almost no temperature dependence in the measured range of 2–300 K.
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