Abstract

A fully integrated output capacitor-less, nMOS regulation FET low-dropout (LDO) regulator with fast transient response for system-on-chip power regulation applications is presented. The error amplifier (EA) consists of a differential cross-coupled common-gate (CG) input stage achieving twice the transconductance and unity-gain-bandwidth in comparison to a conventional differential common-source stage. The low input resistance of the CG EA improves stability of the LDO over a wide range of load currents. The LDO employs a current-reused dynamic biasing technique to further improve the load transient response, with no extra quiescent current. It is designed and fabricated in a 0.18- ${\mu }\text{m}$ CMOS technology for an input voltage range of 1.6–1.8 V, and an output voltage range of 1.4–1.6 V. Measured undershoot is 158 mV and settling time is 20 ns for 9–40 mA load change in 250 ps edge-time with zero load capacitance. The LDO core consumes 130 ${\mu }\text{A}$ of quiescent current, occupies 0.21 mm2 die area, and sustains 0–50 pF of on-chip load capacitance.

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