Abstract
The life testing experiments are essential in different aspects in modern age. The most of the products are highly durable due to the advancement of science and technology. One of the problems that the experimenter faces during life testing experiment is to obtain adequate number of failures within an affordable time. Different techniques have been devised to overcome it. Two techniques, viz., censoring schemes and accelerated life tests are gaining popularity in recent times. In this chapter, we introduce different censoring schemes and accelerated life tests. The step-stress life test is introduced as a special case of accelerated life test. Several models have been proposed in literature to describe the lifetime under a step-stress life test. In this chapter we discuss cumulative exposure model, tempered random variable model, tempered failure model and cumulative risk model. Finally we conclude this chapter providing the organization of this manuscript.
Published Version
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