Abstract
We have discussed step-stress life test in the presence of only one failure mode in the previous chapters. However, an item can fail due to any one of the several causes in a reliability experiment. In this chapters, we discuss the inferential issues related to step-stress life test in the presence of competing or complementary risks. The latent failure time model and its use in the modelling of step-stress life test are outlined. The inferences related to the exponential distribution based on the cumulative exposure and cumulative risk model are provided. The inferential procedures for the parameters of the Weibull distribution based on the tampered failure rate model is also addressed. The complementary risks model is discussed. We list several results without proofs. However, the references are provided for further study. Several open problems have been suggested for future research.
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