Bibliography

Abstract

Free Access Bibliography Narayanaswamy Balakrishnan, Narayanaswamy BalakrishnanSearch for more papers by this authorMan Ho Ling, Man Ho LingSearch for more papers by this authorHon Yiu So, Hon Yiu SoSearch for more papers by this author Book Author(s):Narayanaswamy Balakrishnan, Narayanaswamy BalakrishnanSearch for more papers by this authorMan Ho Ling, Man Ho LingSearch for more papers by this authorHon Yiu So, Hon Yiu SoSearch for more papers by this author First published: 26 February 2021 https://doi.org/10.1002/9781119664031.biblio AboutPDFPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare References M. Abramowitz and I. A. Stegun. Handbook of Mathematical Functions, with Formulas, Graphs and Mathematical Tables . US Government Printing Office, Washington, DC, 1972. H. Akaike. On entropy maximization principle. In P. R. Krishnaiah, editor, Applications of Statistics, pages 27– 41. North-Holland, Amsterdam, 1977. H. Akaike. On entropy maximization principle likelihood of a model and information criteria. Journal of Econometrics, 16: 3– 14, 1981. A. A. Alhadeed and S. S. Yang. Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE Transactions on Reliability, 54: 64– 68, 2005. F. J. Anscombe. The transformation of Poisson, binomial and negative-binomial data. Biometrika, 35: 246– 254, 1948. R. Antoine, H. Doss, and M. Hollander. On identifiability in the autopsy model of reliability theory. Journal of Applied Probability, 30: 913– 930, 1993. M. Aslam and C. H. Jun. A group acceptance sampling plan for truncated life test having Weibull distribution. Journal of Applied Statistics, 36: 1021– 1027, 2009. D. S. Bai, M. S. Kim, and S. H. Lee. Optimum simple step-stress accelerated life tests with censoring. IEEE Transactions on Reliability, 38: 528– 532, 1989. L. J. Bain and M. Engelhardt. Reliability test plans for one-shot devices based on repeated samples. Journal of Quality Technology, 23: 304– 311, 1991. N. Balakrishnan. Progressive censoring methodology: An appraisal (with discussions). Test, 16: 211– 296, 2007. N. Balakrishnan. A synthesis of exact inferential results for exponential step-stress models and associated optimal accelerated life tests. Metrika, 69: 351– 396, 2008. N. Balakrishnan and A. P. Basu. ( Eds . ) The Exponential Distribution: Theory, Methods and Applications. Taylor and Francis, Philadelphia, 1995. N. Balakrishnan and E. Chimitova. Goodness-of-fit tests for one-shot device accelerated life testing data. Communications in Statistics - Simulation and Computation, 46: 3723– 3734, 2017. N. Balakrishnan and A. C. Cohen. Order Statistics and Inference: Estimation Methods. Academic Press, Boston, 1991. N. Balakrishnan and E. Cramer. The Art of Progressive Censoring: Applications to Reliability and Quality. Birkhäuser, Boston, 2014. N. Balakrishnan and C. D. Lai. Continuous Bivariate Distributions, Second edition. Springer, New York, 2010. N. Balakrishnan and M. H. Ling. EM algorithm for one-shot device testing under the exponential distribution. Computational Statistics & Data Analysis, 56: 502– 509, 2012a. N. Balakrishnan and M. H. Ling. Multiple-stress model for one-shot device testing data under exponential distribution. IEEE Transactions on Reliability, 61: 809– 821, 2012b. N. Balakrishnan and M. H. Ling. Expectation maximization algorithm for one shot device accelerated life testing with Weibull lifetimes, and variable parameters over stress. IEEE Transactions on Reliability, 62: 537– 551, 2013. N. Balakrishnan and M. H. Ling. Gamma lifetimes and one-shot device testing analysis. Reliability Engineering & System Safety, 126: 54– 64, 2014a. N. Balakrishnan and M. H. Ling. Best constant-stress accelerated life-test plans with multiple stress factors for one-shot device testing under a Weibull distribution. IEEE Transactions on Reliability, 63: 944– 952, 2014b. N. Balakrishnan, D. Kundu, H. K. T. Ng, and N. Kannan. Point and interval estimation for a simple step-stress model with Type-II censoring. Journal of Quality Technology, 39: 35– 47, 2007. N. Balakrishnan, H. Y. So, and M. H. Ling. EM algorithm for one-shot device testing with competing risks under exponential distribution. Reliability Engineering & System Safety, 137: 129– 140, 2015. N. Balakrishnan, H. Y. So, and M. H. Ling. A Bayesian approach for one-shot device testing with exponential lifetimes under competing risks. IEEE Transactions on Reliability, 65: 469– 485, 2016a. N. Balakrishnan, H. Y. So, and M. H. Ling. EM algorithm for one-shot device testing with competing risks under Weibull distribution. IEEE Transactions on Reliability, 65: 973– 991, 2016b. N. Balakrishnan, E. Castilla, N. Martin, and L. Pardo. Robust estimators and test statistics for one-shot device testing under the exponential distribution. IEEE Transactions on Information Theory, 65: 3080– 3096, 2019a. N. Balakrishnan, E. Castilla, N. Martin, and L. Pardo. Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data. Metrika, 82: 991– 1019, 2019b. N. Balakrishnan, E. Castilla, N. Martin, and L. Pardo. Robust inference for one-shot device testing data under Weibull lifetime model. IEEE Transactions on Reliability, 69: 937– 953, 2020a. N. Balakrishnan, E. Castilla, N. Martin, and L. Pardo. Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses. Quality and Reliability Engineering International, 36: 1916– 1930, 2020b. N. Balakrishnan, E. Castilla, N. Martin, and L. Pardo. Statistical inference for one-shot devices based on density power divergences: An overview. In B.C. Arnold, N. Balakrishnan, and C. Coelho, editors, Contributions to Statistical Distribution Theory and Inference – Festschrift in Honor of C. R. Rao on the Occasion of His 100th Birthday. Springer, New York, 2020c. G. Barmalzan, S. M. Ayat, N. Balakrishnan, and R. Roozegar. Stochastic comparisons of series and parallel systems with dependent heterogeneous extended exponential components under Archimedean copula. Journal of Computational and Applied Mathematics, 380: 112965, 2020. S. Basak, A. Basu, and M. C. Jones. On the ‘optimal’ density power divergence tuning parameter. Journal of Applied Statistics, 2020. A. Basu, I. R. Harris, N. L. Hjort, and M. C. Jones. Robust and efficient estimation by minimising a density power divergence. Biometrika, 85: 549– 559, 1998. A. Basu, H. Shioya, and C. Park. Statistical Inference: The Minimum Distance Approach. Chapman and Hall/CRC Press, New York, 2011. A. Basu, A. Mandal, N. Martin, and L. Pardo. Generalized Wald-type tests based on minimum density power divergence estimators. Statistics, 50: 1– 26, 2016. A. Basu, A. Ghosh, N. Martin, and L. Pardo. Robust Wald-type tests for non-homogeneous observations based on the minimum density power divergence estimators. Metrika, 81: 493– 522, 2018. S. Basu. Masked failure data: competing risks. In F. Ruggeri, R. S. Kenett, and F. W. Faltin, editors, Encyclopedia of Statistics in Quality and Reliability. John Wiley & Sons, Chichester, England, 2008. B. Berlin, J. Brodsky, and P. Clifford. Testing disease dependence in survival experiments with serial sacrifice. Journal of the American Statistical Association, 74: 5– 14, 1979. G. K. Bhattacharyya and Z. Soejoeti. A tampered failure rate model for step-stress accelerated life test. Communications in Statistics - Theory and Methods, 18: 1627– 1643, 1989. G. Casella and R. L. Berger. Statistical Inference, Second edition. Brooks/Cole, Boston, 2002. Y. Cheng and E. A. Elsayed. Reliability modeling and prediction of systems with mixture of units. IEEE Transactions on Reliability, 65: 914– 928, 2016. Y. Cheng and E. A. Elsayed. Reliability modeling of mixtures of one-shot units under thermal cyclic stresses. Reliability Engineering & System Safety, 167: 58– 66, 2017. Y. Cheng and E. A. Elsayed. Reliability modeling and optimization of operational use of one-shot units. Reliability Engineering & System Safety, 176: 27– 36, 2018. U. Cherubini, E. Luciano, and W. Vecchiato. Copula Methods in Finance. John Wiley & Sons, Hoboken, New Jersey, 2004. F. Y. Chiyoshi. Modeling dependence with copulas: a useful tool for field development decision process. Journal of Petroleum Science and Engineering, 44: 83– 91, 2018. A. C. Cohen. Truncated and Censored Samples: Theory and Applications. Marcel Dekker, New York, 1991. D. R. Cox. Regression models and life tables. Journal of the Royal Statistical Society: Series B, 34: 187– 220, 1972. D. R. Cox and D. Oakes. Analysis of Survival Data. Chapman and Hall, London, England, 1984. R. V. Craiu and T. Duchesne. Inference based on the EM algorithm for the competing risks model with masked causes of failure. Biometrika, 91: 543– 558, 2004. E. Cramer and U. Kamps. Sequential k -out- n systems. In N. Balakrishnan and C. R. Rao, editors, Handbook of Statistics Vol. 20, Advances in Reliability, pages 301– 372. North-Holland, Amsterdam, 2001. M. H. DeGroot and P. K. Goel. Bayesian estimation and optimal designs in partially accelerated life testing. Naval Research Logistics Quarterly, 26: 223– 235, 1979. L. A. Escobar and W. Q. Meeker. Planning accelerated life tests with two or more experimental factors. Technometrics, 37: 411– 427, 1995. T. H. Fan, N. Balakrishnan, and C. C. Chang. The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing. Journal of Statistical Computation and Simulation, 79: 1143– 1154, 2009. L. Fang, N. Balakrishnan, and Q. Jin. Optimal grouping of heterogeneous components in series-parallel and parallel-series systems under Archimedean copula dependence. Journal of Computational and Applied Mathematics, 377: 112916, 2020. W. Feller. An Introduction to Probability Theory and Its Applications - Vol. I. John Wiley & Sons, New York, 1971. M. Fréchet. Les tableaux de corrlation et les programmes liné aires. Revue de l'Institut international de statistique, pages 23– 40, 1957. C. Genest and J. MacKay. The joy of copulas: bivariate distributions with uniform marginals. The American Statistician, 40: 280– 283, 1986. A. Ghosh and A. Basu. Robust estimation for independent non-homogeneous observations using density power divergence with applications to linear regression. Electronic Journal of Statistics, 7: 2420– 2456, 2013. E. Gouno. An inference method for temperature step-stress accelerated life testing. Quality and Reliability Engineering International, 17: 11– 18, 2001. E. Gouno. Optimum step stress for temperature accelerated life testing. Quality and Reliability Engineering International, 23: 915– 924, 2007. H. Guo, S. Honecker, A. Mettas, and D. Ogden. Reliability estimation for one-shot systems with zero component test failures. In Proceedings-Annual Reliability and Maintainability Symposium, RAMS, pages 1– 7, 2010. F. R. Hampel, E. M. Ronchetti, P. J. Rousseeuw, and W. A. Stahel. Robust Statistics: The Approach based on Influence Functions. John Wiley & Sons, 1986. W. K. Hastings. Monte Carlo sampling methods using Markov chains and their applications. Biometrika, 57: 97– 109, 1970. H. P. Hong, W. Zhou, S. Zhang, and W. Ye. Optimal condition-based maintenance decisions for systems with dependent stochastic degradation of components. Reliability Engineering & System Safety, 121: 276– 288, 2014. M. H. Hoyle. Transformations: an introduction and a bibliography. International Statistical Review, 41: 203– 223, 1973. D. Huard, G. Évin, and A. C. Favre. Bayesian copula selection. Computational Statistics & Data Analysis, 51: 809– 822, 2006. C. P. Hwang and H. Y. Ke. A reliability analysis technique for quantal-response data. Reliability Engineering & System Safety, 41: 239– 243, 1993. X. Jia, L. Wang, and C. Wei. Reliability research of dependent failure systems using copula. Communications in Statistics - Simulation and Computation, 43: 1838– 1851, 2014. H. Joe. Dependence Modeling with Copulas. CRC Press, Boca Raton, Florida, 2014. N. L. Johnson, S. Kotz, and N. Balakrishnan. Continuous Univariate Distributions - Vol 1, Second edition. John Wiley & Sons, New York, 1994. N. L. Johnson, S. Kotz, and N. Balakrishnan. Continuous Univariate Distributions - Vol 2, Second edition. John Wiley & Sons, New York, 1995. M. Kendall. A new measure of rank correlation. Biometrika, 30: 81– 89, 1938. D. K. Kim and J. M. Taylor. Transform-both-sides approach for overdispersed binomial data when N is unobserved. Journal of the American Statistical Association, 89: 833– 845, 1994. R. L. Kodell and C. J. Nelson. An illness-death model for the study of the carcinogenic process using survival/sacrifice data. Biometrics, 36: 267– 277, 1980. S. Kotz, N. Balakrishnan, and N. L. Johnson. Continuous Multivariate Distributions - Vol.1, Second edition. John Wiley & Sons, New York, 2000. S. Kullback and R. A. Leibler. On information and sufficiency. The Annals of Mathematical Statistics, 22: 79– 86, 1951. J. H. Lau, G. Harkins, D. Rice, J. Kral, and B. Wells. Experimental and statistical analyses of surface-mount technology PLCC solder-joint reliability. IEEE Transactions on Reliability, 37: 524– 530, 1988. C. T. Lin, Y. Y. Hsu, S. Y. Lee, and N. Balakrishnan. Inference on constant stress accelerated life tests for log-location-scale lifetime distributions with Type-I hybrid censoring. Journal of Statistical Computation and Simulation, 89: 720– 749, 2019. J. C. Lindsey and L. M. Ryan. A three state multiplicative model for rodent tumorigenicity experiments. Journal of the Royal Statistical Society: Series C, 42: 283– 300, 1993. M. H. Ling. Optimal design of simple step-stress accelerated life test for one-shot devices under exponential distributions. Probability in the Engineering and Informational Sciences, 33: 121– 135, 2019. M. H. Ling and N. Balakrishnan. Model mis-specification analyses of Weibull and gamma models for one-shot device testing data. IEEE Transactions on Reliability, 66: 641– 650, 2017. M. H. Ling and X. W. Hu. Optimal design of simple step-stress accelerated life test for one-shot devices under Weibull distributions. Reliability Engineering & System Safety, 193: 106630, 2020. M. H. Ling, H. Y. So, and N. Balakrishnan. Likelihood inference under proportional hazards model for one-shot device testing. IEEE Transactions on Reliability, 65: 446– 458, 2016. M. H. Ling, P. S. Chan, H. K. T. Ng, and N. Balakrishnan. Copula models for one-shot device testing data with correlated failure modes. Communications in Statistics - Theory and Methods, 2020. T. A. Louis. Finding the observed information matrix when using the EM algorithm. Journal of the Royal Statistical Society: Series B, 44: 226– 233, 1982. G. J. McLachlan and T. Krishnan. The EM Algorithm and Extensions, Second edition. John Wiley & Sons, Hoboken, New Jersey, 2008. W. Q. Meeker and L. A. Escobar. Statistical Methods for Reliability Data. John Wiley & Sons, Hoboken, New Jersey, 2014. W. Q. Meeker and G. J. Hahn. How to Plan an Accelerated Life Test: Some Practical Guidelines . American Society for Quality Control, Milwaukee, 1985. W. Q. Meeker, G. J. Hahn, and L. A. Escobar. Statistical Intervals: A Guide for Practitioners and Researchers, Second edition. John Wiley & Sons, Hoboken, New Jersey, 2017. I. Meilijson. Estimation of the lifetime distribution of the parts from the autopsy statistics of the machine. Journal of Applied Probability, 18: 829– 838, 1981. R. W. Miller and W. B. Nelson. Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability, 32: 59– 65, 1983. D. B. Montgomery. Design and Analysis of Experiments, 8th edition. John Wiley & Sons, Hoboken, New Jersey, 2013. M. D. Morris. A sequential experimental design for estimating a scale parameter from quantal life testing data. Technometrics, 29: 173– 181, 1987. B. M. Mun, C. Lee, S. G. Jang, B. T. Ryu, and S. J. Bae. A Bayesian approach for predicting functional reliability of one-shot devices. International Journal of Industrial Engineering, 26: 71– 82, 2019. D. N. P. Murthy, M. Xie, and R. Jiang. Weibull Models. John Wiley & Sons, Hoboken, New Jersey, 2003. H. Nagatsuka and N. Balakrishnan. A consistent method of estimation for the parameters of the three-parameter inverse Gaussian distribution. Journal of Statistical Computation and Simulation, 83: 1915– 1931, 2013. H. Nagatsuka and N. Balakrishnan. Consistent estimation of parameters and quantiles of the three-parameter gamma distribution based on type-ii right-censored data. Journal of Statistical Computation and Simulation, 85: 2406– 2424, 2015. H. Nagatsuka and N. Balakrishnan. Existence, uniqueness and consistency of estimation of life characteristics of three-parameter weibull distribution based on type-ii right censored data. Journal of Statistical Computation and Simulation, 86: 1248– 1279, 2016. H. Nagatsuka, T. Kamakura, and N. Balakrishnan. A consistent method of estimation for the three-parameter Weibull distribution. Computational Statistics & Data Analysis, 58: 210– 226, 2013. R. B. Nelsen. An Introduction to Copulas. Springer, New York, 2007. W. B. Nelson. Accelerated life testing - step-stress models and data analyses. IEEE Transactions on Reliability, 29: 103– 108, 1980. W. B. Nelson. Applied Life Data Analysis. John Wiley & Sons, Hoboken, New Jersey, 2003. W. B. Nelson. Accelerated Testing: Statistical Models, Test Plans, and Data Analysis. John Wiley & Sons, Hoboken, New Jersey, 2009. M. Newby. Monitoring and maintenance of spares and one shot devices. Reliability Engineering & System Safety, 93: 588– 594, 2008. M. S. Nikulin and R. Tahir. Application of Sedyakin's model and Birnbaum-Saunders family for statistical analysis of redundant systems with one warm stand-by unit. Journal of Mathematical Sciences, 188: 724– 734, 2013. S. Nowik. Identifiability problems in coherent systems. Journal of Applied Probability, 27: 862– 872, 1990. C. C. Pan and L. Chu. Reliability assessment for one-shot product with Weibull lifetime components. International Journal of Quality & Reliability Management, 27: 596– 610, 2010. Z. Pan, N. Balakrishnan, Q. Sun, and J. Zhou. Bivariate degradation analysis of products based on Wiener processes and copulas. Journal of Statistical Computation and Simulation, 83: 1316– 1329, 2013. L. Pardo. Statistical Inference based on Divergence Measures. Chapman and Hall/CRC Press, New York, 2006. C. Park. Parameter estimation of incomplete data in competing risks using the EM algorithm. IEEE Transactions on Reliability, 54: 282– 290, 2005. F. Pascual. Accelerated life test planning with independent Weibull competing risks with known shape parameter. IEEE Transactions on Reliability, 56: 85– 93, 2007. W. Peng, Y. F. Li, Y. J. Yang, S. P. Zhu, and H. Z. Huang. Bivariate analysis of incomplete degradation observations based on inverse Gaussian processes and copulas. IEEE Transactions on Reliability, 65: 624– 639, 2016. H. Pham. ( Ed . ) Springer Handbook of Engineering Statistics. Springer, New York, 2006. G. O. Roberts and J. S. Rosenthal. Optimal scaling for various Metropolis-Hastings algorithms. Statistical Science, 16: 351– 367, 2001. G. O. Roberts, A. Gelman, and W. R. Gilks. Weak convergence and optimal scaling of random walk Metropolis algorithms. The Annals of Applied Probability, 7: 110– 120, 1997. G. Schwarz. Estimating the dimension of a model. The Annals of Statistics, 6: 461– 464, 1978. B. Schweizer. Thirty years of copulas. In G. Dall'Aglio, S. Kotz, and G. Salinetti, editors, Advances in Probability Distributions with Given Marginals, pages 13– 50. Springer, Dordrecht, The Netherlands, 1991. N. M. Sedyakin. On one physical principle in reliability theory. Technical Cybernetics, 3: 80– 87, 1966. M. Shaked and N. D. Singpurwalla. A Bayesian approach for quantile and response probability estimation with applications to reliability. Annals of the Institute of Statistical Mathematics, 42: 1– 19, 1990. A. Sklar. Fonctions de repartition an dimensions et leurs marges. Publications de l'Institut de statistique de l'Université de Paris, 8: 229– 231, 1959. A. Sklar. Random variables, joint distribution functions, and copulas. Kybernetika, 9: 449– 460, 1973. L. J. Slater. Generalized Hypergeometric Functions, Reissue edition. Cambridge University Press, Cambridge, England, 2008. W. B. Thomas and R. E. Betts. Electroexplosive device, 1967. J. R. Tovar and J. A. Achcar. Dependence between two diagnostic tests with copula function approach: a simulation study. Communications in Statistics - Simulation and Computation, 42: 454– 475, 2013. S. T. Tseng, N. Balakrishnan, and C. C. Tsai. Optimal step-stress accelerated degradation test plan for gamma degradation processes. IEEE Transactions on Reliability, 58: 611– 618, 2009. D. Valis, Z. Vintr, and M. Koucky. Contribution to modeling of complex weapon system reliability. In Proceedings of the European Safety and Reliability Conference, pages 1813–1818, 2008. A. Vassilious and A. Mettas. Understanding accelerated life-testing analysis. Annual Reliability and Maintainability Symposium Tutorial Notes, pages 1– 21, 2001. R. Viveros and N. Balakrishnan. Statistical inference from start-up demonstration test data. Journal of Quality Technology, 25: 119– 130, 1993. B. X. Wang, K. Yu, and Z. Sheng. New inference for constant-stress accelerated life tests with Weibull distribution and progressively Type-II censoring. IEEE Transactions on Reliability, 63: 807– 815, 2014. L. Wang. Inference of constant-stress accelerated life test for a truncated distribution under progressive censoring. Applied Mathematical Modelling, 44: 743– 757, 2017. W. D. Wang and D. B. Kececioglu. Fitting the Weibull log-linear model to accelerated life-test data. IEEE Transactions on Reliability, 49: 217– 223, 2000. J. Warwick and M. C. Jones. Choosing a robustness tuning parameter. Journal of Statistical Computation and Simulation, 75: 581– 588, 2005. H. White. Maximum likelihood estimation of misspecified models. Econometrica, 50: 1– 25, 1982. C. Xiong, K. Zhu, and M. Ji. Analysis of a simple step-stress life test with a random stress-change time. IEEE Transactions on Reliability, 55: 67– 74, 2006. W. Y. Yun, Y. J. Han, and H. W. Kim. Simulation-based inspection policies for a one-shot system in storage over a finite time span. Communications in Statistics - Simulation and Computation, 14: 1979– 2003, 2014. M. Zelen. Factorial experiments in life testing. Technometrics, 1: 269– 288, 1959. A. Zellner. An Introduction to Bayesian Inference in Econometrics. John Wiley & Sons, New York, 1971. J. R. Zhang, X. Y. Li, T. M. Jiang, and Z. Z. Ge. Optimization of the test stress levels of an ADT. In Proceedings-Annual Reliability and Maintainability Symposium, RAMS, pages 1– 6, 2011. X. P. Zhang, J. Z. Shang, X. Chen, C. H. Zhang, and Y. S. Wang. Statistical inference of accelerated life testing with dependent competing failures based on copula theory. IEEE Transactions on Reliability, 63: 764– 780, 2014. Y. Zhang and W. Q. Meeker. Bayesian life test planning for the Weibull distribution with given shape parameter. Metrika, 61: 237– 249, 2005. W. Zhao and E. A. Elsayed. A general accelerated life model for step-stress testing. IIE Transactions, 37: 1059– 1069, 2005. J. Zheng, Y. Li, J. Wang, E. Shiju, and X. Li. Accelerated thermal aging of grease-based magnetorheological fluids and their lifetime prediction. Materials Research Express, 5: 085702, 2018. Accelerated Life Testing of One‐shot Devices ReferencesRelatedInformation