The contributions to the magnetic anisotropy of thin-film rings and lines of width 50 nm and above made from $\text{Ti}(5\text{ }\text{nm})/{\text{Co}}_{0.66}{\text{Cr}}_{0.22}{\text{Pt}}_{0.12}$ (10 and 20 nm)/Ti (3 nm) with a perpendicular magnetocrystalline anisotropy are investigated, using magnetic force microscopy to image the ac-demagnetized state. Four regimes of behavior were observed in both lines and rings. Samples with the largest widths $(>500\text{ }\text{nm})$ showed an out-of-plane maze domain structure typical of unpatterned films with domain widths of $\ensuremath{\sim}200\text{ }\text{nm}$. As the linewidth decreased, a ''bamboo'' domain structure forms in which the domain walls lie approximately perpendicular to the linewidth. Further linewidth decreases result in a reorientation to a net in-plane anisotropy perpendicular to the linewidth, and for the narrowest lines, $<200\text{-nm}$ wide, the anisotropy reorients in plane parallel to the line. The evolution of anisotropy is modeled in terms of contributions from magnetocrystalline, shape, and first- and second-order magnetoelastic terms, and good agreement with experiment is obtained, considering both bulk and surface anisotropy contributions.
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