Shockley Read Hall Research Articles

In‐gap States and Carrier Recombination in Quasi‐2D Perovskite Films

In‐gap states and their effect on recombination rates in quasi‐2D lead–iodide‐based perovskites, intercalated with various spacer molecules, are studied using a combination of scanning tunneling spectroscopy and temperature‐dependent photoconductivity measurements. The results are further analyzed by a Shockley–Read–Hall model. Indications for shallow in‐gap states, positioned at about 0.15–0.2 eV below the bottom of the conduction band, are found. These states are identified as dominating the recombination route of photogenerated carriers in these systems, with a relatively large capture coefficient of about 10−5–10−6 cm3 s−1 at room temperature. First‐principles calculations based on density functional theory imply that these states are not an intrinsic effect of the inclusion of the spacer molecules, but rather one that arises from chemical defect formation or structural deformation of the perovskite layers. The results suggest that further improvement of the performance of solar cells that are based on quasi‐2D perovskites requires, along with enhancing carrier mobility, efforts to suppress the concentration of these detrimental defect states.

Optical Absorption, Photocarrier Recombination Dynamics and Terahertz Dielectric Properties of Electron-Irradiated GaSe Crystals

Optical absorption spectra of 9 MeV electron-irradiated GaSe crystals were studied. Two absorption bands with the low-photon-energy threshold at 1.35 and 1.73 eV (T = 300 K) appeared in the transparency region of GaSe after the high-energy-electron irradiation. The observed absorption bands were attributed to the defect states induced by Ga vacancies in two charge states, having the energy positions at 0.23 and 0.61 eV above the valence band maximum at T = 300 K. The optical pump-terahertz probe technique (OPTP) was employed to study the dark and photoexcited terahertz conductivity and charge carrier recombination dynamics at two-photon excitation of as-grown and 9 MeV electron-irradiated GaSe crystals. The measured values of the differential terahertz transmission at a specified photoexcitation condition were used to extract the terahertz charge carrier mobilities. The determined terahertz charge carrier mobility values were ~46 cm2/V·s and ~14 cm2/V·s for as-grown and heavily electron-irradiated GaSe crystals, respectively. These are quite close to the values determined from the Lorentz–Drude–Smith fitting of the measured dielectric constant spectra. The photo-injection-level-dependent charge carrier lifetimes were determined from the measured OPTP data, bearing in mind the model injection-level dependencies of the recombination rates governed by interband and trap-assisted Auger recombination, bulk and surface Shockley–Read–Hall (SRH) recombination and interband radiative transitions in the limit of a high injection level. It was found that GaSe possesses a long charge carrier lifetime (a~1.9 × 10−6 ps−1, b~2.7 × 10−21 cm3ps−1 and c~1.3 × 10−37 cm6ps−1), i.e., τ~0.53 μs in the limit of a relatively low injection, when the contribution from SRH recombination is dominant. The electron irradiation of as-grown GaSe crystals reduced the charge carrier lifetime at a high injection level due to Auger recombination through radiation-induced defects. It was found that the terahertz spectra of the dielectric constants of as-grown and electron-irradiated GaSe crystals can be fitted with acceptable accuracy using the Lorentz model with the Drude–Smith term accounting for the free-carrier conductivity.

A Comprehensive Guide to Bifacial Perovskite Solar Cells: Simulation and Optimization

AbstractBifacial perovskite solar cells (PSCs) have received much attention from researchers and scientists. Recently, a certified power conversion efficiency (PCE) of 21.40% (front illumination) and 20.01% (rear illumination) of bifacial PSC has shown immense potential to take over the photovoltaic industry. However, the PCE bifacial PSCs still have a long way to go, as compared to their mono‐facial PSCs counterparts (PCE 26.1%). This gap in the performance level propels us to get more insight into the device physics of bifacial PSCs. In this work, bifacial PSCs are simulated and optimized by selecting an appropriate choice of the electron transport layer (ETL) and hole transport layer (HTL). In this study, it is found that the conduction band offset (CBO) and valance band offset (VBO) play a vital role in choosing a proper charge‐selective layer. The band alignment highly affects the Shockley‐Read‐Hall (SRH) recombination rate and consequently, the device performance. The bandgap of the rear transparent electrode (RTE) plays a vital role in photo‐absorption and band alignment at the HTL/RTE interface and hence the device performance. This investigation reveals that the perovskite absorber material should be intrinsic in semiconducting nature to achieve a higher bifacial factor from the device.

Bias-dependent degradation of single quantum well on InGaN-based light emitting diode

This paper investigates the factors that influence the efficiency and the reliability of InGaN-based light emitting diodes. The devices under test have a single InGaN quantum well, with a nominal emission wavelength of 495 nm. From the preliminary characterization, the L-I curve shows an anomalous slope mainly due to: i) high Shockley Read Hall recombination rate, and ii) low electron densities in the explored range of injection, as also confirmed by simulation. The reliability of the devices was investigated by performing a constant current stress test at J = 80 A/cm2 at room temperature. Optical degradation occurs with different trends, depending on the injection regime. For low injection levels, the optical power decay is monotonic. In the high injection range, for I > 10 mA, we can recognize different degradation phases. The optical degradation can be ascribed to the generation and relocation of defects in the active region, as also confirmed by DLOS measurement. The origin of degradation was also investigated by a stress test with photoluminescence measurement. The results suggest that the variation of the optical characteristics can be related to the variation of the intrinsic characteristics of the material.

CsSn0.5Ge0.5I3‐Based Lead‐Free Highly Stable Perovskite Solar Cell: Numerical Modeling for Estimating Performance Ceiling

CsSn0.5Ge0.5I3 perovskite is reportedly highly stable in ambient open air, lead free, and has excellent optoelectrical properties. An inverted p–i–n solar cell device based on this mixed SnGe perovskite utilizing the reported optical and electrical characteristics of the CsSn0.5Ge0.5I3 is simulated. This theoretical device under various recombination regimes to explore the performance ceiling of CsSn0.5Ge0.5I3 is put. An optimized configuration of CsSn0.5Ge0.5I3‐based perovskite solar cell shows an efficiency of 29% under the impact of only intrinsic recombination losses such as radiative (with radiative recombination coefficient of 10−11) and Auger recombination (recombination coefficient of 10−27). When extrinsic factors are considered, such as resistance losses (series resistance as high as 2 Ω cm2 and shunt resistance as low as 1000 Ω cm2), efficiency decreases to 27.5%. The efficiency is 20% when trap‐assisted Shockley–Read–Hall recombination is considered with voltage loss (V Loss) of 0.5 V. Similarly, V Loss = 0.6 V in V OC restricts device efficiency to 15%. Finally, an efficiency waterfall chart summarizes the CsSn0.5Ge0.5I3, efficiency under different extrinsic losses, and the performance loss analysis, providing an optimal design. The results summarized here are expected to be helpful and prompt experimentalists to fabricate this stable lead‐free perovskite solar cell.

Influence of trap-assisted and intrinsic Auger–Meitner recombination on efficiency droop in green InGaN/GaN LEDs

We study the impact of deep-level defects on trap-assisted Auger–Meitner recombination in c-plane InGaN/GaN LEDs using a small-signal electroluminescence (SSEL) method and deep-level optical spectroscopy (DLOS). Carrier dynamics information, including carrier lifetime, recombination rate, and carrier density, is obtained from SSEL, while DLOS is used to obtain the deep-level defect density. Through fitting the nonradiative recombination rates of wafers with different deep-level defect densities, we obtain the Shockley–Read–Hall (SRH) and trap-assisted Auger–Meitner recombination (TAAR) coefficients. We show that defect-related nonradiative recombination, including both SRH and TAAR, accounts for a relatively small fraction of the total nonradiative recombination, which is dominated by intrinsic Auger–Meitner recombination. The interplay between carrier localization and Coulomb enhancement has a different impact on radiative and intrinsic Auger–Meitner recombination. Evidence is presented that the imbalance between the change of radiative and intrinsic Auger–Meitner recombination is the primary cause of the efficiency droop at high carrier densities in the samples studied.

DLTS Study of Defects in HgCdTe Heterostructure Photodiode

Deep-level transient spectroscopy (DLTS) measurements were performed on HgCdTe heterostructure photodiode grown by metal-organic chemical vapor deposition (MOCVD) on GaAs substrate. In order to extract defects from individual layers of the heterostructure, three consecutive etchings were performed. In the first experiment, the N+/T/p/T/P+/n+ structure was chemically etched to the N+ bottom contact to obtain a mesa-type detector. Six localized defects were extracted across the entire photodiode. In the second experiment, the bottom contact was made to the p-type absorber. Two localized defects were found in the p/T/P+/n+ structure. In the third experiment, the top layers were removed and N+/T/p type detector was made—the cap contact was made to the p-type absorber, the bottom to the N+ layer. Five defect levels were identified, three of which overlap with the first experiment. A deep-trap level located at 183 meV above the top of the valence band was identified within the absorber bandgap. This energy coincides with the activation energy determined from the Arrhenius plot for the dark currents. A defect at the level of ∼0.5Eg suggests that the dark current at low reverse bias voltage is dominated by the Shockley–Read–Hall (SRH) mechanism.

Effect of Mg doping on carrier recombination in GaN

Time-resolved photoluminescence measurements have been performed on Mg-doped GaN for Mg concentrations in the low- to mid-1019 cm−3. As-grown and annealed (600–675 °C) samples were studied. In the as-grown samples, the nonradiative carrier lifetime was found to be about 200 ps and nearly independent of the Mg concentration. Upon annealing, the carrier lifetimes shorten to ∼150 ps but, again, show little dependence on the annealing temperature. The analysis of possible Shockley–Read–Hall recombination centers and their behavior during doping and annealing suggests that the main nonradiative recombination center is the Mg–nitrogen vacancy complex. The weak dependence of the PL decay times on temperature indicates that carrier capture into this center has a very low potential barrier, and the nonradiative recombination dominates even at low temperatures.

Investigation on Effect of Interface Trap Charges and Temperature in Gate Overlap Graphene Source Step Shape Double Gate Tunnel FET

Abstract This work evaluates the electrical parameters of Gate Overlap Graphene source Step Shape Double Gate TFET (GO-GR-SSDG-TFET) with wide variation in interface trap charges (ITCs) and temperature. Here, both the positive interface charges (PITCs) and negative interface charges (NITCs) along with temperature ranges from 200-500 K on DC, RF/analog and linearity characteristics are analyzed using TCAD Sentaurus Simulator. It is observed that there is improvement (degradation) in current ratio, transconductance, gain, cut-off frequency, and delay with increase (decrease) in PITC (NITC), whereas, opposite trend is realized in terms of linearity parameters. The rise in temperature leads to degradation is subthreshold behaviour due to exponential characteristic of Shockley-Read-Hall (SRH) recombination with temperature. It is also seen that at high temperature there is degradation transconductance, device efficiency, cut-off frequency, current ratio, delay, and temperature sensitivity (ST) in the proposed TFET. Moreover, the linearity parameters are degraded with rise in temperature. Finally, a comparison table is highlighted in terms of various electrical parameters for proposed TFET with existing data.

Nonradiative Dynamics Induced by Vacancies in Wide-Gap III-Nitrides: Ab Initio Time-Domain Analysis.

Insightful understanding of defect properties and prevention of defect damage are among the biggest issues in the development of photoelectronic devices based on wide-gap III-nitride semiconductors. Here, we have investigated the vacancy-induced carrier nonradiative dynamics in wide-gap III-nitrides (GaN, AlN, and AlxGa1-xN) by ab initio molecular dynamics and nonadiabatic (NA) quantum dynamics simulations since the considerable defect density in epitaxy samples. E-h recombination is hardly affected by Vcation, which created shallow states near the VBM. Our findings demonstrate that VN in AlN creates defect-assisted nonradiative recombination centers and shortens the recombination time (τ) as in the Shockley-Read-Hall (SRH) model. In GaN, VN improves the NA coupling between the CBM and the VBM. Additionally, increasing x in the AlxGa1-xN alloys accelerates nonradiative recombination, which may be an important issue in further improving the IQE of high Al-content AlxGa1-xN alloys. These findings have significant implications for the improvement of wide-gap III-nitrides-based photoelectronic devices.

Electrical Relaxation and Transport Properties of ZnGeP2 and 4H-SiC Crystals Measured with Terahertz Spectroscopy

Terahertz photoconductivity and charge carrier recombination dynamics at two-photon (ZnGeP2) and three-photon (4H-SiC) excitation were studied. Thermally annealed, high-energy electron-irradiated and Sc-doped ZnGeP2 crystals were tested. The terahertz charge carrier mobilities were extracted from both the differential terahertz transmission at a specified photoexcitation condition and the Drude–Smith fitting of the photoconductivity spectra. The determined terahertz charge carrier mobility values are ~453 cm2/V·s for 4H-SiC and ~37 cm2/V·s for ZnGeP2 crystals. The charge carrier lifetimes and the contributions from various recombination mechanisms were determined at different injection levels using the model, which takes into account the influence of bulk and surface Shockley–Read–Hall (SRH) recombination, interband radiative transitions and interband and trap-assisted Auger recombination. It was found that ZnGeP2 possesses short charge carrier lifetimes (a~0.01 ps−1, b~6 × 10−19 cm3·ps−1 and c~7 × 10−40 cm6·ps−1) compared with 4H-SiC (a~0.001 ps−1, b~3 × 10−18 cm3·ps−1 and c~2 × 10−36 cm6·ps−1), i.e., τ~100 ps and τ~1 ns at the limit of relatively low injection, when the contribution from Auger and interband radiative recombination is small. The thermal annealing of as-grown ZnGeP2 crystals and the electron irradiation reduced the charge carrier lifetime, while their doping with 0.01 mass % of Sc increased the charger carrier lifetime and reduced mobility. It was found that the dark terahertz complex conductivity of the measured crystals is not fitted by the Drude–Smith model with reasonable parameters, while their terahertz photoconductivity can be fitted with acceptable accuracy.

Effects of high-dose 80 MeV proton irradiation on the electroluminescent and electrical performance of InGaN light-emitting diodes

The paper reports on the degradation of InGaN/GaN Blue LED submitted to proton irradiation at 80 MeV and various fluences (4×1013 p cm−2 and 1×1014 p cm−2). After irradiation, we found a decrease in light output power and the external quantum efficiency with fluence. Photoluminescence (PL) measurements exhibited that the peak position at 400, 447 and 568 nm remained unchanged, only the peak intensity decreased. The intensity of the blue emission reduced by 75%, indicating that the active region degraded seriously; the intensity from In x Ga1-x N (x = 0.11) reduced more than two times in comparison with the blue emission, implying that proton irradiation affected In x Ga1-x N more seriously than InGaN/GaN MQWs. The degradation of LED is ascribed to the increase in the defect-related Shockley–Read–Hall recombination after 80 MeV proton irradiation with higher fluence.

Simulation of Capacitorless DRAM Based on the Polycrystalline Silicon Nanotube Structure with Multiple Grain Boundaries.

In this study, a capacitorless one-transistor dynamic random-access memory (1T-DRAM), based on polycrystalline silicon (poly-Si) nanotube structure with a grain boundary (GB), is designed and analyzed using technology computer-aided design (TCAD) simulation. In the proposed 1T-DRAM, the 1T-DRAM cell exhibited a sensing margin of 422 μA/μm and a retention time of 213 ms at T = 358 K with a single GB. To investigate the effect of random GBs, it was assumed that the number of GB is seven, and the memory characteristics depending on the location and number of GBs were analyzed. The memory performance rapidly degraded due to Shockley-Read-Hall recombination depending on the location and number of GBs. In the worst case, when the number of GB is 7, the mean of the sensing margin was 194 µA/µm, and the mean of the retention time was 50.4 ms. Compared to a single GB, the mean of the sensing margin and the retention time decreased by 59.7% and 77.4%, respectively.

Modification of Hydrophobic Self‐Assembled Monolayers with Nanoparticles for Improved Wettability and Enhanced Carrier Lifetimes Over Large Areas in Perovskite Solar Cells

The development of perovskite solar cells (PSCs) with low recombination losses at low processing temperatures is an area of growing research interest as it enables compatibility with roll‐to‐roll processing on flexible substrates as well as with tandem solar cells. The inverted or p–i–n device architecture has emerged as the most promising PSC configuration due to the possibility of using low‐temperature processable organic hole‐transport layers and more recently, self‐assembled monolayers such as [4‐(3,6‐dimethyl‐9H‐carbazol‐9‐yl)butyl]phosphonic acid (Me‐4PACz). However, devices incorporating these interlayers suffer from poor wettability of the precursor leading to pin hole formation and poor device yield. Herein, the use of alumina nanoparticles (Al2O3 nanoparticles (NPs)) for pinning the perovskite precursor on Me‐4PACz is demonstrated, thereby improving the device yield. While similar wettability enhancements can also be achieved by using poly[(9,9‐bis(3′‐((N,N‐dimethyl)‐N‐ethylammonium)‐propyl)‐2,7‐fluorene)‐alt‐2,7‐(9,9‐dioctylfluorene)]dibromide (PFN‐Br), a widely employed surface modifier, the incorporation of Al2O3 NPs results in significantly enhanced Shockley–Read–Hall recombination lifetimes exceeding 3 μs, which is higher than those on films coated directly on Me‐4PACz and on PFN‐Br‐modified Me‐4PACz. This translates to a champion power conversion efficiency of 19.9% for PSCs fabricated on Me‐4PACz modified with Al2O3, which is a ≈20% improvement compared to the champion device fabricated on PFN‐Br‐modified Me‐4PACz.

Stability of Cu(InxGa1−x)Se2 Solar Cells Utilizing RbF Postdeposition Treatment under a Sulfur Atmosphere

Alkali halide postdeposition treatments (PDTs) have become a key tool to maximize efficiency in Cu(InxGa1−x)Se2 (CIGS) photovoltaics. RbF PDTs have emerged as an alternative to the more common Na‐ and K‐based techniques. This study utilizes temperature‐dependent current–voltage (JVT) measurements to study a unique RbF PDT performed in a S atmosphere. The samples are measured before and after 6 months in a desiccator to study device stability. Both samples contain Na and K which diffuse from the soda–lime glass substrate. A reference sample and a RbF + S PDT sample both show the development of a rear contact barrier after aging. The contact barrier is higher for the RbF + S PDT sample, leading to decreased current in forward bias. Series resistance is also higher in the RbF + S PDT device which leads to lower fill factor. However, after aging the reference sample has a larger decrease in open‐circuit voltage (VOC). Ideality factor measurements suggest Shockley–Read–Hall recombination dominates both samples. VOC versus temperature and a temperature‐dependent activation energy model are used to calculate diode activation energies for each sample condition. Both techniques produce similar values that indicate recombination primarily occurs within the bulk absorber.

Investigation on external quantum efficiency droops and inactivation efficiencies of AlGaN-based ultraviolet-c LEDs at 265–285 nm

The temperature-dependent external quantum efficiency (EQE) droops of 265 nm, 275 nm, 280 nm, and 285 nm AlGaN-based ultraviolet-c light-emitting diodes (UVC-LEDs) differed in Al contents have been comprehensively investigated. The modified ABC model (R = An + Bn 2 + Cn 3) with the current-leakage related term, f(n) = Dn 4, has been employed to analyze the recombination mechanisms in these UVC-LED samples. Experimental results reveal that, at relatively low electrical-current levels, the contribution of Shockley–Read–Hall (SRH) recombination exceeds those of the Auger recombination and carrier leakage. At relatively high electrical-current levels, the Auger recombination and carrier leakage jointly dominate the EQE droop phenomenon. Moreover, the inactivation efficiencies of 222 nm excimer lamp, 254 nm portable Mercury lamp, 265 nm, 280 nm, and 285 nm UVC-LED arrays in the inactivation of Escherichia coli have been experimentally investigated, which could provide a technical reference for fighting against the new COVID-19.

Modeling Lattice Matched Dilute Nitride Triple and Quadruple Junction Solar Cells on Virtual SiGe Substrate

A lattice matched triple junction solar cell (TJSC) structure with a GaAs0.58 P0.42 top cell and bandgap tunable GaNxAs1-x-zPz middle and bottom cells on virtual SiGe substrate is proposed in this study. SiGe/Si substrate is preferred as it is a low-cost substrate and because it provides a lattice constant at which bandgap tunable dilute nitride materials that are appropriate for highly efficient multijunction solar cells can be obtained. By changing the nitrogen content in GaNxAs1-x-zPz, the bandgap of the middle and bottom subcells is adjusted to the optimum values. The bandgap of the top cell is constant at 1.95 eV. Three models with different values of surface recombination velocities and Shockley–Read–Hall recombination lifetimes are applied to the presented TJSC structure. Peak efficiencies of 48.9%, 40.6% and 33.7% are achieved at EG2 = 1.45 eV and EG3 = 1.04 eV for Model 1, EG2 = 1.45 eV and EG3 = 1.15 eV for Model 2, and EG2 = 1.5 eV and EG3 = 1.17 eV for Model 3, respectively. A fourth bandgap adjustable GaNxAs1-x-zPz junction is inserted into the system and a significant improvement is obtained under high sun concentration for Models 1 and 2. The presented original results are very promising because the variable bandgaps provide very efficient absorption of incoming spectrum.

Numerical device modeling for direct Z-scheme junctions using a solar cell simulator

Carbon capture and utilization (CCU) is a promising solution for reducing reliance on fossil fuels and incentivizing the capture of CO2. A key requirement for CCU is the development of effective photo/electrocatalysts with high CO2 reduction activity that can produce high-value products. Direct Z-scheme heterojunctions named after their charge transfer mechanism, use sunlight to conduct various photocatalytic reactions, similar to photosynthesis in plants. Solar cell simulation techniques can be used to obtain material properties and insights into the electronic characteristics of these materials. By solving semiconductor differential equations that model the behavior of semiconductors under different light intensities and applied biases, the solar cell simulator program (SCAPS) can evaluate the energy band edges, carrier concentrations, and output characteristics of the device. In this study, a method is proposed for modeling direct Z-scheme junctions in SCAPS by simulating the Shockley Read Hall (SRH) recombination using defect densities at the interface of the recombination junction (RJ). An example using a TiO2/CdIn2S4 Z-scheme junction is presented and the impact of defects on the performance of the junction is discussed. It is presented that the high recombination rates at the interface via these defects improve the device performance.

Tailoring the Charge Carrier Lifetime Distribution of 10 kV SiC PiN Diodes by Physical Simulations

In this paper, Shockley-Read-Hall (SRH) lifetime depth profiles in the drift layer of 10 kV SiC PiN diodes are calculated after MeV proton implantation. It is assumed that the carbon vacancy will be the domination trap for charge carrier recombination and the SRH lifetime is calculated with defect parameters from the literature and proton-induced defect distributions deduced from SRIM calculations. The lifetime profiles are imported to Sentaurus TCAD and static and dynamic simulations using tailored lifetime profiles are carried out to study the electrical effect of proton implantation parameters. The results are compared to measurements, specializing on optimization of the trade off between on-state and turn-off losses, represented by the forward voltage drop, VT, and reverse recovery charge, Qrr, respectively. Both the simulated and measured IV characteristics show that increasing proton dose, or energy, has the effect on increasing forward voltage drop and on-state losses, while simultaneously, the localized SRH lifetime drop decreases the plasma level, increases the speed of recombination and decreases reverse recovery charge. Finally, TCAD simulations with different combinations of proton energies and fluences are used to optimize the trade-off between static and dynamic performances. Reverse recovery charge and forward voltage drops of these groups of diodes are plotted together, showing that a medium energy which induces the most defects in the depletion region relatively close to the anode gives the best dynamic performances, with a minimum cost of static performance.

Interfacial trap charge and self-heating effect based reliability analysis of a Dual-Drain Vertical Tunnel FET

This manuscript exclusively addresses the reliability concern of a double-drain vertical TFET (DD-VTFET) by analysing the influence of interface trap charges and variation in ambient temperature on various DC and analog/RF figure of merits. For detailed analysis, performance of the device is evaluated by considering different densities and polarities of trap charges existing at gate-oxide/channel interface. TCAD-based simulation results reveal that trap charges significantly alter the flat-band voltage, which further causes variation in the device performance. It is observed from the transfer characteristic curve that the leakage current is degraded from 10−18 to 10−13A/μm when a positive (donor) charge density of 1013 cm−2 is introduced at oxide/channel interface. However, cut-off frequency is found to be improved under the influence of donor traps, which is mainly attributed due to improvement in transconductance of the device. Moreover, simulation results indicate that DD-VTFET is immune to the negative (acceptor) traps in comparison with the positive traps. Furthermore, the analysis carried out for temperature affectability on the device performance suggests that, at higher ambient temperature, the off-state current degrades more in subthreshold region (at low gate bias) due to dominance of the Shockley-Read-Hall (SRH) and trap-assisted tunneling (TAT) mechanisms, which exponentially depend on the temperature. Therefore, the leakage current increases approximately by an order 7 when temperature is increased from 200 K to 400 K. Since band-to-band tunneling starts dominating over SRH and TAT in the super-threshold region (at high gate bias), the impact of temperature variation along with presence of the trap charges is found to be insignificant on the transfer characteristics.