Electron beam welding technology is increasingly used in industrial manufacturing due to its high power density and the purity of welded joints. In vacuum environments, traditional optical and machine vision monitoring methods are susceptible to contamination by metal vapors, which hinders the monitoring effect. Due to the limitations of optical monitoring methods, electronic optical imaging technology is a new alternative monitoring method that has been introduced into the electron beam processing in recent years, but the complexity of the industrial electron beam welding environment makes it relatively less studied in the field of electron beam welding. In this study, a YAG scintillator detector is proposed to collect the backscattered electron information generated by the interaction of electrons with the sample, and an FPGA real-time processing system is used to realize the weld quality monitoring in the industrial electron beam welding processes. The distribution law of backscattered electrons in space is simulated by Monte Carlo method, and the results show that the number of distribution in the 40°∼60° angle region is more, the backscattering coefficient increases with the increase of the incident angle of the electron beam, and the backscattering coefficient of the samples with large atomic numbers is relatively high. The field monitoring experiments show that the designed system exhibits good sensitivity to the characteristic morphology, and the imaging resolution reaches more than 200 μm, and the weld hole defects are clearly visible. A good linear correlation between the current change curve during scanning and the actual shape profile is shown, while the image resolution is better when the spot current is 1 mA.
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