We have developed a laser-based photoemission microspectrometer which achieved an energy resolution of < 30 meV and a lateral resolution of 0.3 μm. The light source was fs-coherent radiation at a wavelength of 140 nm (8.9 eV). The images based on the intensity of the Shockley-surface-state feature clearly showed that many crystalline grains with (111) surfaces were formed on a polycrystalline copper plate. The high-energy-resolution spectroscopy allows detailed insights on the nm-scale morphology. Another feature of the spectrometer is the measurement of unoccupied states by employing time-resolved two-photon photoemission. Surface images based on the unoccupied image-potential state were successfully measured. We have applied the spectrometer to copper phthalocyanine films grown on a polycrystalline copper substrate. The results demonstrate that a large inhomegeneity exists in the interface electronic structure.