Phase Measuring Deflectometry (PMD) is a non-contact, high dynamic-range and full-field metrology which becomes a serious competitor to interferometry. However, the accuracy of deflectometry metrology is strongly influenced by the level of the calibrations, including test geometry, imaging pin-hole camera and digital display. In this paper, we propose a novel method that can measure optical flat surface figure to a high accuracy. We first calibrate the camera using a checker pattern shown on a LCD display at six different orientations, and the last orientation is aligned at the same position as the test optical flat. By using this method, lens distortions and the mapping relationship between the CCD pixels and the subaperture coordinates on the test optical flat can be determined at the same time. To further reduce the influence of the calibration errors on measurements, a reference optical flat with a high quality surface is measured, and then the system errors in our PMD setup can be eliminated by subtracting the figure of the reference flat from the figure of the test flat. Although any expensive coordinates measuring machine, such as laser tracker and coordinates measuring machine are not applied in our measurement, our experimental results of optical flat figure from low to high order aberrations still show a good agreement with that from the Fizeau interferometer.
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