Logic built-in self-test (LBIST) eliminates the need for external test data, and thus facilitates in-field testing. Instead of pseudo-random tests that are typically produced by on-chip test generation logic, storage-based LBIST uses deterministic test data entries, which are stored on-chip, for applying tests that are closer to deterministic tests. This article describes a storage-based LBIST approach that uses a unique type of scan-based tests referred to as cyclic tests. Cyclic tests have cyclic scan enable and scan in sequences, with a higher proportion of functional capture cycles compared with conventional scan-based tests. This results in more clock cycles where fault effects can be captured in the flip-flops. The improved fault detection capabilities this provides helps balance the number of applied tests and the storage requirements. Experimental results for benchmark circuits demonstrate the effectiveness of cyclic tests.