This study introduces an all-digital delay-locked loop (ADDLL), which generates 20 evenly-spaced-phase clock signals. A successive-approximation register (SAR)-based dual-loop control is used to realize the locking process of the ADDLL. A modified SAR unit combined with a tri-state digital phase detector (TSDPD) is adopted to achieve a closed-loop operation of the ADDLL. A delay matrix, which can significantly reduce the jitter accumulation, is used to generate evenly spaced phases without using a long-cascaded delay line. Additional harmonic-lock detector circuits are added to the two control loops to avoid the harmonic lock issue. The ADDLL is designed and fabricated using a 0.18μm mixed-signal CMOS technology with an active area of 0.109 μm2. The lock range of the ADDLL is 30–230 MHz and the power consumption of the ADDLL is 8.9 mW at 100 MHz. The measured rms jitter is 23.3 ps at 100 MHz, and the results show a good linearity of the multiphase outputs at a 100 MHz input clock where the maximum DNL and INL are 0.08 and -0.22 LSB, respectively. The proposed ADDDLL is highly suitable for low-frequency, low-power, and high-time-resolution applications.
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