High performance is one of the essential features of the electronic devices, which are needed to cope with the consumer demand of high frequency operation thus leading to a complex design. As dynamic CMOS corresponds to high speed operation, a low gate count and power/noise efficient configuration of domino logic circuit is tendered in this article. The simulation is executed for 90 nm CMOS process node at a power supply of 1V to formulate the design of AND, OR and XOR operation. The post-layout study of 2 input OR gate records an average power dissipation and delay of 17.40 μW and 86.88 ps, which are noted to measure a variability of 5.76% and 4.30% respectively when investigated under 5000 statistical runs of Monte-Carlo. The stability of the design is observed as power, delay and PDP are noted to sustain a shift of as tiny as 24.84 nW, 271 fs and 2.68 aJ respectively following a 1 °C variation in temperature. The configuration is also tested for wide fan-in gates and found to carry resilience under extreme deviations of process–voltage–temperature. The scalability of proposed domino setup is validated at a lower process node of UMC 28 nm.
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