Abstract Traditional industrial surface defect detection often employs CCD/CMOS cameras, but they are difficult to detect the minute defects on aluminum substrates in highly dynamic industrial scenes due to their nature. Event camera is a novel high-resolution vision sensor which measures per-pixel brightness changes in an asynchronous manner and outputs as event information flow (EIF). Small and weak defects on aluminum substrate can be captured by event camera effectively, but the EIF contain a large amount of noise, making it difficult to perform accurate and high-precision defect detection. To address this problem, we propose a frame aggregation method to realize good event information flow processing (EIFP), and then use an improved circle detection method to locate the aluminum substrate in each frame, removing abundant event information outside the aluminum substrate. Subsequently, we enhance the event signals under different frames based on optical flow tracking using multiple features, and construct a semi-supervised detector based on pseudo-labels to achieve high-precision defect localization. Finally, considering the small inter-class differences in defects on the surface of aluminum substrates, we construct a defect class corrector based on ensemble learning to enhance the ability to determine defect classes, achieving high-precision automatic quality inspection of aluminum substrate surfaces. The performance of our method is compared with other advanced methods based on event camera data of aluminum substrates in real industrial scenarios. The experimental results show that our method has improved the detection accuracy by about 10% and the classification accuracy by about 25% compared to the original state-of-the-art methods.
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