Abstract
This study advances Surface Inspection (SI) in display panel manufacturing using a data‐centric approach, addressing high gray zone rates and data discrepancies. We employed a data flywheel method with dual labeling to improve dataset quality. Results show expanded automated coverage and enhanced classification, reducing defect leakage, demonstrating AI's impact in smart manufacturing processes.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
