The Hall coefficient RH and the magneto-resistance Δρ⁄ρ0 were measured near 4.2 K on HgTe single crystals annealed at 553-723 K in the Hg vapour of 300 Pa-500 kPa.RH and Δρ⁄ρ0 showed the dependence upon the magnetic field in the range between 0 and 960 kA/m. Analyzing these results by the two carrier model, the carrier concentrations, Ne and Nh, and the carrier mobilities, μe and μh, were obtained. The subscripts e and h refer to electron and hole, respectively. Ne was in proportion to Hg vapour pressure PHg, while Nh was in reverse proportion to that in the experimental range of PHg. μe and μh had the maximum μe∗ and μh∗ at almost the same PHg∗, respectively. Both varied in proportion to PHg1⁄2 in the case of PHg<PHg∗, but to PHg−1⁄2 in the reverse case. The concentration product Ne·Nh was calculated at different temperatures and found to be constant independent of temperature, even though the crystals were annealed at different temperatures and pressures. The value of Ne·Nh⁄T3 was plotted against 1⁄T, and then thermal energy gap Eg=−0.32 meV was obtained from the slope of the curve. The negative value suggested that HgTe behaved as semimetallic.