True Random Number Generator Research Articles

Novel Certification Method for Quantum Random Number Generators

Random numbers have many uses, but finding true randomness is incredibly difficult. Therefore, quantum mechanics is used, using the essentially unpredictable behavior of a photon, to generate truly random numbers that form the basis of many modern cryptographic protocols. It is essential to trust cryptographic random number generators to generate only true random numbers. This is why certification methods are needed which will check both the performance of our device and the quality of the random bits generated. Self-testing as well as device independent quantum random number generation methods are analyzed in the paper. The advantages and disadvantages of both methods are identified. The model of a novel semi self-testing certification method for quantum random number generators is offered in the paper. This method combines different types of certification approaches and is rather secure and efficient. The method is very important for computer science, because it combines the best features from selftesting and device independent methods. It can be used, when the random numbers’ entropy depends on the device and when it does not. In the related researches, these approaches are offered to be used separately, depending on the random number generator. The offered novel certification technology can be properly used, when the device is compromised or spoiled. The technology can successfully detect unintended irregularities, operational problems, abnormalities and problems in the randomization process. The offered mythology assists to eliminate problems related to physical devices. The offered system has the higher certification randomness security and is faster than self-testing approaches. The method is rather efficient because it implements the different certification approaches in the parallel threads. The offered techniques make the offered research must more efficient than the other existing approaches. The corresponding programming simulation is implemented by means of the simulation techniques.

Design and Analysis of Configurable Ring Oscillators for True Random Number Generation Based on Coherent Sampling

True Random Number Generators (TRNGs) are indispensable in modern cryptosystems. Unfortunately, to guarantee high entropy of the generated numbers, many TRNG designs require a complex implementation procedure, often involving manual placement and routing. In this work, we introduce, analyse, and compare three dynamic calibration mechanisms for the COherent Sampling ring Oscillator based TRNG: GateVar , WireVar , and LUTVar , enabling easy integration of the entropy source into complex systems. The TRNG setup procedure automatically selects a configuration that guarantees the security requirements. In the experiments, we show that two out of the three proposed mechanisms are capable of assuring correct TRNG operation even when an automatic placement is carried out and when the design is ported to another Field-Programmable Gate Array (FPGA) family. We generated random bits on both a Xilinx Spartan 7 and a Microsemi SmartFusion2 implementation that, without post processing, passed the AIS-31 statistical tests at a throughput of 4.65 Mbit/s and 1.47 Mbit/s, respectively.

Behavioral Analysis and Immunity Design of the RO-Based TRNG under Electromagnetic Interference

True random-number generators based on ring oscillators (RO-based TRNG) are widely used in the field of information encryption because of their simple structure and compatibility with CMOS technology. However, radiated or conducted electromagnetic interference can dramatically deteriorate the randomness of the output bitstream of the RO-based TRNG, which poses a great threat to security. Traditional research focuses on the innovation of the means of attack and the detection of circuit states. There is a lack of research on the interference mechanism and anti-interference countermeasures. In this paper, the response of the RO array to electromagnetic interference was analyzed, and the concept of synchronous locking was proposed to describe the locking scene of multiple ROs. On the basis of synchronous locking, the RF immunity of the RO-based TRNG was modeled, which can explain the degradation mechanism of bitstream randomness under RFI. Moreover, the design method of gate-delay differentiation is presented to improve the RF immunity of the RO-based TRNG at a low cost. Both transistor-level simulation and board-level measurement proved the rationality of this scheme.

40 Gb/s quantum random number generation based on optically sampled amplified spontaneous emission

We present a photonic approach for fast quantum random number generation based on optically sampled amplified spontaneous emission (ASE). This approach utilizes a terahertz optical asymmetric demultiplexer to sample the ASE and then digitize the sampled optical pulses into random bits using a multi-bit parallel comparator. A proof-of-concept experiment demonstrates that 40 Gb/s random bits with verified randomness can be obtained using our method. The current generation rate is mainly limited by the bandwidth of the available ASE source.

Corrigendum to “Efficient hardware implementation and analysis of true random‐number generator based on beta source”

Efficient hardware implementation and analysis of true random-number generator based on beta source https://doi.org/10.4218/etrij.2020-0083 ETRI Journal, Volume 42, Issue 4, August 2020, pp. 518–526. In the article entitled “Efficient hardware implementation and analysis of true random-number generator based on beta source”, the authors would like to correct the funding information of their article. It should be written as follows: Funding information This research was supported by Nuclear Technology Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning (No. 2018M2A8A1083094). The authors would like to apologize for the inconvenience caused.

Design and implementation of true random number generators based on semiconductor superlattice chaos

True random number generator (TRNG) is of the fundamental guarantees of information security. However, the commercially-available all-electronic TRNGs, no matter whether the thermal-noise-based or the oscillator-based ones, can merely reach the speed of a few Mbit/s due to the very limited entropy source, which is unable to meet the requirements of ultra-high-speed and ultra-large capacity of information propagation or storage. This paper proposes the design and implementation of semiconductor superlattice random number generator (SSL-RNG) by employing semiconductor superlattice chaos as entropy source. We introduce the entropy estimation method to evaluate the raw data from the entropy harvester quantitatively, thus optimized the parameter design of the LFSR-Toeplitz extractor for post-processing. We have also integrated the entropy acquisition circuit into an embedded FPGA-based platform as a standalone design to trade off the performance and cost. The resulting hardware's output passes the NIST standard statistical test with a full entropy throughput above 300 Mbit/s.

Advanced Data Encryption ​using 2D Materials.

Advanced data encryption requires the use of true random number generators (TRNGs) to produce unpredictable sequences of bits. TRNG circuits with high degree of randomness and low power consumption may be fabricated by using the random telegraph noise (RTN) current signals produced by polarized metal/insulator/metal (MIM) devices as entropy source. However, the RTN signals produced by MIM devices made of traditional insulators, i.e., transition metal oxides like HfO2 and Al2 O3 , are not stable enough due to the formation and lateral expansion of defect clusters, resulting in undesired current fluctuations and the disappearance of the RTN effect. Here, the fabrication of highly stable TRNG circuits with low power consumption, high degree of randomness (even for a long string of 224 - 1 bits), and high throughput of 1 Mbit s-1 by using MIM devices made of multilayer hexagonal boron nitride (h-BN) is shown. Their application is also demonstrated to produce one-time passwords, which is ideal for the internet-of-everything. The superior stability of the h-BN-based TRNG is related to the presence of few-atoms-wide defects embedded within the layered and crystalline structure of the h-BN stack, which produces a confinement effect that avoids their lateral expansion and results in stable operation.

Quantum Entropy Model of an Integrated Quantum-Random-Number-Generator Chip

We present the physical model for the entropy source of a quantum random number generator chip based on the quantum fluctuations of the photon number emitted by light-emitting diodes. This model, combined with a characterization of the chip, estimates a quantum min-entropy of over 0.98 per bit without post-processing. Finally, we show with our model that the performances in terms of security are robust against fluctuations over time.

Self-clocking fast and variation tolerant true random number generator based on a stochastic mott memristor

The intrinsic stochasticity of the memristor can be used to generate true random numbers, essential for non-decryptable hardware-based security devices. Here, we propose a novel and advanced method to generate true random numbers utilizing the stochastic oscillation behavior of a NbOx mott memristor, exhibiting self-clocking, fast and variation tolerant characteristics. The random number generation rate of the device can be at least 40 kb s−1, which is the fastest record compared with previous volatile memristor-based TRNG devices. Also, its dimensionless operating principle provides high tolerance against both ambient temperature variation and device-to-device variation, enabling robust security hardware applicable in harsh environments.

A True Random Number Generator Based on Ionic Liquid Modulated Memristors

The memristor-based neuromorphic computing application, which is highly flexible and capable of handling large amounts of parallel information, is one of the major breakthroughs in the past decade....

A true random number generator that utilizes thermal noise in a programmable system‐on‐chip (PSoC)

SummaryThis study presents four designs for a true random number generator (TRNG) for Cypress programmable system‐on‐chip (SoC) (PSoC) devices, whose entropy source is the thermal noise of resistors. The first design includes a ΔΣ analog‐to‐digital converter (ADC) with two external resistors of 6 MΩ, where the resolution was set to 16 bits. The second, third, and fourth designs adopt the internal resistors of a programmable gain amplifier (PGA) as a noise source. The second design adopts a single‐stage PGA (gain 50) with a ΔΣ ADC, while the third design adopts a two‐stage PGA (gain 50 × 50) with a ΔΣ ADC. The fourth design adopts a trans‐impedance amplifier (TIA) with a ΔΣ ADC. All four designs have passed the National Institute of Standards and Technology (NIST) test suite.

A New True Random Number Generator Based on Differential Variable Ring Oscillator Robust Against PVT Variation

In this paper, a new true random number generator (TRNG) based on a new variable differential ring oscillator has been presented. In this structure, the ring oscillator’s jitter is considered a random phenomenon. The jitter of the proposed ring oscillator is driven by thermal noise and flicker noise so that the generated jitter is random. In this paper, a new variable differential ring oscillator has been designed. The stage of this ring oscillator is changed randomly in order to create random jitter. A new differential delay cell has been proposed to boost the speed of TRNG and random jitter. The proposed random number generator (RNG) is robust against temperature variations of [Formula: see text]40–120[Formula: see text] and voltage variations from 0.8 to 1.8[Formula: see text]V. The proposed system’s bitrate is 50[Formula: see text]MB/s and its efficiency is 30.03[Formula: see text]Mb/mJ. This process has been implemented in the 0.18[Formula: see text]um CMOS process. Simulation results have been presented in Hspice software and cadence. The output bit images have been displayed by Matlab software.

Effect of photon statistics on vacuum fluctuations based QRNG

The speed of quantum random number generators (QRNGs) is a major concern for practical applications. In this work, we introduce scattering as a method to enhance the randomness characteristics of the entropy source. This method allows optical bit extraction with a faster sampling rate without compromising the randomness quality compared to the coherent source based balanced homodyne detection. Scattering is a probabilistic phenomenon which increases the chaotic behaviour of coherent sources. It broadens the distribution of photon statistics and makes it super-Poissonian. We show that a signal with super-Poissonian distribution has better randomness compared to a Poissonian one, indicated by their autocorrelation characteristics and the randomness test results. The use of scattering mechanisms as an entropy source eases the miniaturization of QRNGs, it also makes them compatible and adaptable to existing technologies.

Can Deep Learning Break a True Random Number Generator?

True Random Number Generators (TRNGs) create a hardware-based, non-deterministic noise that is used for generating keys, initialization vectors, and nonces in a variety of applications requiring cryptographic protection. A compromised TRNG may lead to a system-wide loss of security. In this brief, we show that an attack combining power analysis with bitstream modification is capable of classifying the output bits of a TRNG implemented in FPGAs from a single power measurement. We demonstrate the attack on the example of an open source AIS-20/31 compliant ring oscillator-based TRNG implemented in Xilinx Artix-7 28nm FPGAs. The combined attack opens a new attack vector which makes possible what is not achievable with pure bitstream modification or side-channel analysis.

Phase-locked Loop with True Random Number Generator for Reference Spur Reduction

This paper presents a phase-locked loop (PLL) that reduces reference spurs by using a true random number generator (TRNG). In conventional PLLs, a frequency component of the reference clock appears spurious tones in the voltage-controlled oscillator (VCO) output. In the proposed PLL, the TRNG randomly delays UP/DOWN signals which result in inconsistent timing of charging/discharging at the output of the charge pump (CP). As a result, the CP output disperses the reference spur of the VCO output by making the reference clock frequency component uneven. The proposed PLL was fabricated in a 180-nm CMOS technology. It dissipates 23 mW at 2-GHz with 1.8-V supply and achieves more than 23 dB of additional spur suppression.

Estimating Coherence Measures with Untrusted Devices

AbstractThe superposition of quantum states, quantified by coherence, is a fundamental feature to distinguish quantum mechanics from classical theories. Estimations of coherence with perfectly characterised devices have been well‐studied. However, imperfections or malfunctions of realistic measurement devices might nullify the characterization. Device‐independent (DI) tests allow to witness and quantify the quantum feature of a system, such as entanglement, without trusting the implementation devices. Although DI test is a powerful tool in many quantum information tasks, it generally requires nonlocal settings. Little is known if single party coherence can be witnessed and estimated via untrusted devices. In this work, coherence witnesses and estimations with untrusted devices are systematically studied. First, a no‐go theorem for detecting existences of single party coherence via a DI or semi DI means is proven. A general prepare‐and‐measure semi DI scheme for witnessing and estimating the amount of coherence is then proposed. How to estimate the relative entropy and the l1 norm of single party coherence with analytical and numerical approaches is shown. As coherence is an essential resource for tasks such as quantum random number generation and quantum key distribution, it is expected that this result may shed light on designing new quantum cryptographic schemes.

Out-of-Band Electromagnetic Injection Attack on a Quantum Random Number Generator

Random number generators underpin the security of current and future cryptographic systems and are therefore a likely target for attackers. Quantum random number generators have been hailed as the ultimate sources of randomness. However, as shown in this work, the susceptibility of the sensitive electronics required to implement such devices poses a serious threat to their security. We present an out-of-band electromagnetic injection attack on a photonic quantum random number generator through which an adversary can gain full control of the output. In our first experiment, the adversary forces the binary output of the generator to become an alternating string of 1s and 0s, with near 100% success. This attack may be spotted by a vigilant user performing statistical tests on their output strings. We therefore envisage a second more subtle attack in which the adversary forces the output to be a random pattern known to them, thus rendering any protection based on statistical tests ineffective.

Random Telegraph Noise in Metal‐Oxide Memristors for True Random Number Generators: A Materials Study

AbstractSome memristors with metal/insulator/metal (MIM) structure have exhibited random telegraph noise (RTN) current signals, which makes them ideal to build true random number generators (TRNG) for advanced data encryption. However, there is still no clear guide on how essential manufacturing parameters like materials selection, thicknesses, deposition methods, and device lateral size can influence the quality of the RTN signal. In this paper, an exhaustive statistical analysis on the quality of the RTN signals produced by different MIM‐like memristors is reported, and straightforward guidelines for the fabrication of memristors with enhanced RTN performance are presented, which are: i) Ni and Ti electrodes show better RTN than Au electrodes, ii) the 50 μm × 50 μm devices show better RTN than the 5 μm × 5 μm ones, iii) TiO2 shows better RTN than HfO2 and Al2O3, iv) sputtered‐oxides show better RTN than ALD‐oxides, and v) 10 nm thick oxides show better RTN than 5 nm thick oxides. The RTN signals recorded have been used as entropy sources in high‐throughput TRNG circuits, which have passed the randomness tests of the National Institute of Standards and Technology. The work can serve as a useful guide for materials scientists and electronic engineers when fabricating MIM‐like memristors for RTN applications.

VLSI Architecture for Designing a True Random Number Generator with Modified Parallel Run Length Encoding

The secured communication is a means to provide privacy and security for the data being transmitted. The cryptographic system has thus become a vital and inevitable platform for achieving data security in our day to day life ranging from the generation of one time passwords, session keys, signature parameters, ephemeral keys. The encryption level is entirely dependent on the unpredictability of the digital bit streams. The paper focuses on generating true random number sequences using hardware, so as to safeguard the encryption keys patterns for digital communications. These sequences are generated using purely digital components supported by an efficient VLSI architecture. The implementation of the proposed model is done using Mojo-V3, supported by Xilinx ISE software platform. The generated random sequences will further undergo some post processing operations, viz; Von-Neumann correction (VNC) and Parallel Run Length Encoding (PRLE), to eliminate the bias in bit stream and also to compensate the high power dissipation respectively.

Tunnel FET‐based ultra‐lightweight reconfigurable TRNG and PUF design for resource‐constrained internet of things

SummaryConventional complementary metal oxide semiconductor (CMOS)‐based dedicated true random number generator (TRNG) and physically unclonable function (PUF) designs have exhibited higher energy consumption and large area overhead with technology scaling. In contrast, this paper for the first time presents emerging tunnel field‐effect transistor (TFET)‐based ultra‐lightweight reconfigurable TRNG and PUF design. A unique methodology is proposed that considers p‐i‐n forward current characteristics to generate random keys for PUF and TRNG designs. Leveraging the p‐i‐n forward current of TFET, a ring oscillator (RO) is designed that exhibits variation in the operating frequency and acts as the main source of entropy for both PUF and TRNG. The TRNG in the proposed design is robust and passed all the National Institute of Standards and Technology (NIST) tests. Considering the variation in p‐i‐n forward current, the uniqueness of PUF is calculated as 47.5% and 46% at a supply voltage of 0.5 and 0.45 V, respectively. Moreover, PUF achieves high reliability of 82% and 88.7% with supply voltage and temperature variations, respectively. The proposed design is proved to be compact with relatively lower gate count and shows low energy consumption of 4.8 pJ/bit at 0.5‐V supply voltage. With these performance metrics, the proposed design is highly suitable for resource‐constrained internet of things (IoT).