AbstractThis article analyzes results from two papers that have studied the first sharp diffraction peak, FSDP, in GexSe1‐x alloys as a function of the alloy composition, x. The research reported in one of these papers obtained the FSDP in eighteen closely spaced compositions for x between 0.15 and 0.4, and included the intermediate phase, IP, regime between x = ∼0.2 and ∼0.25. S(Q) structure factor plots from diffraction measurements were characterized empirically in terms with several different fitting functions. These second paper used Monte‐Carlo methods for a smaller set of compositions. In this paper, the positions and widths of the FSDP's peaks as a function of alloy composition are correlated with changes in the atomic bonding from Se‐rich to Ge‐rich regimes. Additionally this paper identifies medium range order, MRO, length scales for chemical bonding self‐organizations within the IP regime that are important for promoting macroscopic strain reduction. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)