The electron-ion recombination coefficient γ and the avalanche coefficient δ = ( α − a) · v d , where α and a are the ionizat ion and attachment coefficients respectively and v d the drift velocity of the electrons, have been experimentally determined in a self-sustained CO 2-laser system (1:1:3 mixture) as a function of the E/ N value. For low voltages we found the expected decrease of the recombination coefficient for increasing E/ N values. However, it appears that for larger voltage the recombination coefficient increases sharply for increasing E/ N values. The measurements of δ show a much smaller value than expected from theoretical calculations. This must be explained by a lower value of the electron-energy distribution function for higher energies, which may be consistent with our measured high recombination probability for electrons having high energy.
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