Luminescent materials which convert high energy photons to visible light are used for medical X-ray radiography. These materials contain luminescent centers with high efficiency, for example trivalent Tb ions in oxysulfide gadolinium ceramic. Generally, luminescent materials for X-ray radiography exhibit slower decay times than scintillators for photon-counting applications, however they also exhibit low afterglow. In this study, we researched about X-ray excited luminescence characteristics of sodium aluminium phosphate glass which is lower melting point than oxysulfide gadolinium ceramic. Tb doping concentrations of sodium aluminium phosphate samples were 0.3, 1.0, 3.0 and 10%, respectively. As a result of X-ray excited luminescence, emission peaks at wavelengths of around 480, 540, 580 and 620 nm were observed from each samples. Intensity of X-ray excited luminescence were increased with increasing of Tb doping concentration. Decay curves of samples were also evaluated by using X-ray induced afterglow characterization system [1] which was developed by our laboratory. Slow decay curves with time range of 20 milliseconds were successfully observed.[1] T. Yanagida, Y. Fujimoto, T. Ito, K. Uchiyama, K. Mori, "Development of X-ray induced afterglow characterization system" Appl. Phys. Exp., 7 062401 (2014).
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