This paper is aimed at presenting a renovated model-building method of transfer function for industrial X-ray digital radiography based on the amorphous silicon X-ray flat-panel detector. The system, known as point-spreading function (PSF), is composed of three parts: the system geometrical dispersion with a non-spot power source, the scintillating screen dispersion and the aperture sampling of the pixel detector. For the innovation purpose, we have first of all established a mathematical simulation of the PSF and the modulation transfer function (MTF) on the basis of analyzing the intensity distribution of X-ray penetration area in each part and by taking Gaussian functions as a mathematical equation for depicting the transfer behavior of each part of the system. And, then, we have worked out the approximately effective bandwidth of the system from its half-wave width. And, finally, by taking the digital radiography based on the flat-panel detector for sampling, the paper has provided a theoretical foundation for the industrial X-ray radiographic testing and measurement operation. In addition, the author has also estimated the validation of the model through experiments and proved that the method helps to make high resolutions of the diacritical tiniest details in the work-pieces, which has shown and will show its technical rationality, technical appropriateness and practical working value.
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