Abstract
Polycrystalline HgI2 thick film detectors are among the leading semiconductor materials to be used as direct converters in X-ray digital radiography. Their properties along with a survey of the properties of alternative materials, such as PbI2 or A-Se, will be given. The preparation of HgI2 detector plates, both by direct evaporation (Physical vapor deposition, (PVD)) and by binding the individual crystallites with polymeric glue, forming screen-printed (SP) detector plates, will be described. The microstructure of the PVD thick films showing a columnar morphology, as determined by SEM measurements, will be shown. The X-ray response to radiological X-ray generator of 85kVp using the current integration mode will be reported for both PVD and SP films. Finally, some X-ray images taken at Xerox–Parc using HgI2 polycrystalline detectors will be shown.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
