One reason we are motivated to do this research is to suggest that it is not necessary to wait until software is fielded before recording and analyzing defects. Assuming there is an effective data collection process in place, we can record actual defects and predict future defects for all software development phases. Our contribution to defect analysis research is the modeling of the process attributes and the product reliability needed for safety critical systems in NASA, using a queuing process approach that we believe is the first of its kind.We feel this approach is important because defect process attributes, such as the time required to correct defects, have a direct bearing on product attributes, such as the number of old defects that remain unrepaired. The model has the capability of computing probabilities of defect prediction and repair, and repair timesThis feature allows unrepaired defects to be fed back into the model queue input, along with the new defects. The result provides a comprehensive template of defect processing that the software engineer can use to assess both the efficacy of defectprocessingandthereliabilityoftheproductthatistheoutcomeoftheprocess.Amajor result was that the module with the highest probability of defect detection corresponds to the modulewiththelowestvaluesofdefectcount,sourcelinesofcode,andcyclomaticcomplexity. Conversely,themodulewiththelowestprobabilitycorrespondstothemodulewiththehighest values of these attributes. Thus, the engineer would be encouraged by these results to use these relationships as a guide to predicting the probability of detection of defects on other softwaresystemswithsimilarattributes.Aremainingchallengeinthisresearch,anissuethat requires resolution, is that a coherent and comprehensive NASA defect and metrics database should be developed to support research.While the individual data items in the NASA IV&V Facility Metrics Data Program data repository are valuable, the defect data is not adequately correlated to the metrics data.
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