In this study, the effects of the CF4 plasma treatment on the amorphous indium gallium zinc oxide (IGZO) material were explored. The electrical characteristics of the IGZO-based field-effect transistor (FET) were also thoroughly examined to analyze the influence of the plasma treatment. Excellent adhesion of the sol-gel-based IGZO semiconducting film was achieved owing to the strong dipole moment of the AlOxFy layer created by the surface treatment. In particular, X-ray photoelectron spectroscopy depth profiles and transmission electron microscopy electron energy loss spectroscopy analyses provided clear evidence that fluorine atoms diffused into the Al2O3 surface via the CF4 plasma treatment. The formation of an AlOxFy layer at the IGZO/Al2O3 interface is expected to be advantageous for reducing the interface trap density, thereby enhancing the critical transistor parameters. Additionally, the plasma-treated IGZO transistor demonstrated strong electrical bias stability under continuous gate bias stress conditions. Therefore, surface modification via CF4 plasma treatment is proposed to boost the stability and performance of the device, offering a straightforward approach for integrated thin-film transistor circuitry in advanced display applications.
Read full abstract