Transient performance is one of the most crucial design properties in digital low-dropout regulator (DLDO) design. In this paper, an improved droop measurement built-in self-test (BIST) circuit for DLDOs is presented, expanding on the previous work (Dirican et al. 2018) by the same authors. The proposed BIST system can detect and store the transient droop information using droop detector and generates a digital output with a reuse based 10-bit successive-approximation (SAR) analog-to-digital converter (ADC) with better accuracy. The improvements are achieved by employing a multi-step ramp circuit and a leakage cancellation circuit. The system is made more suitable for process scaling by replacing the analog buffer with a multi-step ramp circuit. Employing a leakage cancellation circuit solves potential leakage problems during ADC operation due to the reused decoupling capacitor of the DLDO and nearly 75% reduction in maximum measurement error is observed using this feature. Additionally, the droop detector is capable of storing transient droop information with less than 0.6% error for droop voltages ranging from 45 mV to 406 mV for a nominal DLDO output voltage of 1.6 V where the supply voltage is 1.8 V. The proposed BIST circuit is designed using a 0.18 μm CMOS process in Cadence Virtuoso and verified with corner simulations.
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