Journal Article Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation Get access Wenbing Yun, Wenbing Yun Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar SH Lau, SH Lau Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar Benjamin Stripe, Benjamin Stripe Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar Alan Lyon, Alan Lyon Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar David Reynolds, David Reynolds Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar Sylvia JY Lewis, Sylvia JY Lewis Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar Sharon Chen, Sharon Chen Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar Vladimir Semenov, Vladimir Semenov Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar Richard Ian Spink Richard Ian Spink Sigray, Inc. Concord, CA USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 118–119, https://doi.org/10.1017/S1431927616001446 Published: 25 July 2016