Diffracted beam interferometry, DBI, is a practical method of interferometry which removes the strict requirement for a bright, coherent source and extends the availability of holography to a wider community of electron microscopists. The only alteration to the microscope is the installation of an electron biprism into a post-objective lens position. DBI is very flexible as the interferogram can be produced from the conditions of the infocus diffraction (Fraunhofer plane), through the Fresnel (de)focus region to the infocus specimen plane by varying the strength of the post-objective lenses, Fig. 1. As well the convergence of the interfering beams can vary from highly convergent (Fig. 1) to pseudoparallel (Fig. 2). Although the phase in the interferogram due to beam tilt and the contrast transfer function of the prefield objective lens cancel out when the interfering beams are exactly overlaid, the phase due to the spatial frequency of the biprism, KB, the contrast transfer function, uL,R, of the postfield objective lens for each beam, L,R, and the inherent material phase, FL,R, remain.
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